Sensor Electronic Technology, Inc.

Other

Alexander Dobrinsky

Michael Shur

Remigijus Gaska

Maxim S Shatalov

Jinwei Yang

Timothy James Bettles

Rakesh B Jain

Yuri Bilenko

Saulius Smetona

Wenhong Sun

Grigory Simin

Mikhail Gaevski

Igor Agafonov

Robert Mark Kennedy

Alexander Lunev

Arthur Peter Barber

Arthur Peter Barber, Iii

Daniel Billingsley

Ignas Gaska

Emmanuel N Lakios

Faris Mills Morrison Estes

Jordan Frank

Xuhong Hu

Jianyu Deng

Carlton Gibson

Brandon A Robinson

Remigijua Gaska

Igor Shturm

A solution for controlling mildew in a cultivated area is described. The solution can include a set of ultraviolet sources that are configured to emit ultraviolet and/or blue-ultraviolet radiation to harm mildew present on a plant or ground surface. A set of sensors can be utilized to acquire plant data for at least one plant surface of a plant, which can be processed to determine a presence of mildew on the at least one plant surface. Additional features can be included to further affect the growth environment for the plant. A feedback process can be implemented to improve one or more aspects of the growth environment.

Radiation-based mildew control

An improved heterostructure for an optoelectronic device is provided. The heterostructure includes an active region, an electron blocking layer, and a p-type contact layer. The heterostructure can include a p-type interlayer located between the electron blocking layer and the p-type contact layer. In an embodiment, the electron blocking layer can have a region of graded transition. The p-type interlayer can also include a region of graded transition.

Heterostructure including a semiconductor layer with graded composition

Approaches for evaluating fluid based on fluorescent sensing is disclosed. In one approach, a nanoparticle injector is configured to inject nanoparticles into a fluid. A detector is configured to determine a presence of the nanoparticles in the fluid. The detector can include a radiation source configured to irradiate the fluid with a target radiation and a fluorescent meter configured to measure an amount of fluorescence emitted from the fluid irradiated with the radiation. A control unit is configured to determine the a set of attributes corresponding to the fluid as a function of the measured amount of fluorescence.

Fluorescent sensing for evaluating fluid

Aspects of the invention provide a system for disinfecting a humidifier containing a volume of water. An enclosure, such as a humidifier, includes a first chamber, a second chamber, a humidifier component, a third chamber, and a control unit. The first chamber contains a volume of water and a portion of the water flows into the second chamber. A first set of ultraviolet radiation sources within the first chamber can be configured to generate UV-A radiation, while a second set of ultraviolet radiation sources within the second chamber can be configured to generate UV-C radiation. In operation, the humidifier component adjacent to the second chamber creates water vapor using the portion of the volume of water within the second chamber. The water vapor flows into a third chamber that contains the water vapor and releases the water vapor into the ambient.

Humidifier disinfection using ultraviolet light

A semiconductor heterostructure for an optoelectronic device with improved light emission is disclosed. The heterostructure can include a first semiconductor layer having a first index of refraction n1. A second semiconductor layer can be located over the first semiconductor layer. The second semiconductor layer can include a laminate of semiconductor sublayers having an effective index of refraction n2. A third semiconductor layer having a third index of refraction n3 can be located over the second semiconductor layer. The first index of refraction n1 is greater than the second index of refraction n2, which is greater than the third index of refraction n3.

Semiconductor heterostructure with improved light emission

An optoelectronic device configured for improved light extraction through a region of the device other than the substrate is described. A group III nitride semiconductor layer of a first polarity is located on the substrate and an active region can be located on the group III nitride semiconductor layer. A group III nitride semiconductor layer of a second polarity, different from the first polarity, can located adjacent to the active region. A first contact can directly contact the group III nitride semiconductor layer of the first polarity and a second contact can directly contact the group III nitride semiconductor layer of the second polarity. Each of the first and second contacts can include a plurality of openings extending entirely there through and the first and second contacts can form a photonic crystal structure. Some or all of the group III nitride semiconductor layers can be located in nanostructures.

Light extraction from optoelectronic device

A solution for irradiating a flowing fluid through a channel with ultraviolet radiation is provided. Ultraviolet radiation sources can be located within the channel in order to direct ultraviolet radiation towards the flowing fluid and/or the interior of the channel. A valve can be located adjacent to the channel to control the flow rate of the fluid. A control system can control and adjust the ultraviolet radiation based on the flow rate of the fluid and a user input component can receive a user input for the control system to adjust the ultraviolet radiation. The ultraviolet radiation sources, the control system, the user input component, and any other components that require electricity can receive power from a rechargeable power supply. An electrical generator located within the channel can convert energy from the fluid flowing through the channel into electricity for charging the rechargeable power supply.

Ultraviolet irradiation of a flowing fluid

An approach for controlling light exposure of a light sensitive object is described. Aspects of this approach involve using a first set of radiation sources to irradiate the object with visible radiation and infrared radiation. A second set of radiation sources spot irradiate the object in a set of locations with a target ultraviolet radiation having a range of wavelengths. Radiation sensors detect radiation reflected from the object and environment condition sensors detect conditions of the environment in which the object is located during irradiation. A controller controls irradiation of the light sensitive object by the first and second set of radiation sources according to predetermined optimal irradiation settings specified for various environmental conditions. In addition, the controller adjusts irradiation settings of the first and second set of radiation sources as a function of measurements obtained by the various sensors.

Controlling light exposure of light sensitive object

A solution for illuminating plants can include: a set of visible light sources configured to emit visible radiation directed at the plant; a set of infrared radiation sources configured to emit ultraviolet radiation directed at the plant; a feedback component configured to acquire data regarding the plant; and a control unit configured to control and adjust radiation directed at the plant based on the data.

Plant growth system

A heterostructure, such as a group III nitride heterostructure, for use in an optoelectronic device is described. The heterostructure can include a sacrificial layer, which is located on a substrate structure. The sacrificial layer can be at least partially decomposed using a laser. The substrate structure can be completely removed from the heterostructure or remain attached thereto. One or more additional solutions for detaching the substrate structure from the heterostructure can be utilized. The heterostructure can undergo additional processing to form the optoelectronic device.

Heterostructure for an optoelectronic device

An approach for controlling ultraviolet intensity over a surface of a light sensitive object is described. Aspects involve using ultraviolet radiation with a wavelength range that includes ultraviolet-A and ultraviolet-B radiation to irradiate the surface. Light sensors measure light intensity at the surface, wherein each sensor measures light intensity in a wavelength range that corresponds to a wavelength range emitted from at least one of the sources. A controller controls the light intensity over the surface by adjusting the power of the sources as a function of the light intensity measurements. The controller uses the light intensity measurements to determine whether each source is illuminating the surface with an intensity that is within an acceptable variation with a predetermined intensity value targeted for the surface. The controller adjusts the power of the sources as a function of the variation to ensure an optimal distribution of light intensity over the surface.

Controlling intensity over a surface of a light sensitive object

A diffusive layer including a laminate of a plurality of transparent films is provided. At least one of the plurality of transparent films includes a plurality of diffusive elements with a concentration that is less than a percolation threshold. The plurality of diffusive elements are optical elements that diffuse light that is impinging on such element. The plurality of diffusive elements can be diffusively reflective, diffusively transmitting or combination of both. The plurality of diffusive elements can include fibers, grains, domains, and/or the like. The at least one film can also include a powder material for improving the diffusive emission of radiation and a plurality of particles that are fluorescent when exposed to radiation.

Light emitting device for emitting diffuse light

Ultraviolet irradiation of liquids for purposes of sterilization, disinfection, cleaning and/or treatment. A liquid collection reservoir can receive an inflow of a liquid. A filtering unit can filter the inflow of liquid received by the liquid collection reservoir. A liquid chamber stores the liquid. Ultraviolet light emitting sources located about the liquid chamber irradiate the liquid in the liquid chamber with ultraviolet light. A control unit, operatively coupled to the ultraviolet light emitting sources, controls the irradiation of the liquid in the liquid chamber with the ultraviolet light emitting sources. The control unit is configured to control an intensity and a duration of the irradiation as a function of time that the liquid is stored in the liquid chamber and the amount of the liquid that is in the liquid chamber.

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Loudonville, NY, United States of America

Alexander Dobrinsky