Ams Ag

Austriamicrosystems Ag

Alexander Costa

Helmut Theiler

A communication system has a host communication circuit and a client communication circuit, which are connected to each other by means of a single signal wire. The host communication circuit generates a voltage modulated signal on the signal wire based on a reference clock signal, which in each clock cycle has a first period with a significant voltage change based on a clock edge of the reference clock signal, and a second period with a basically constant voltage variation. The host communication circuit (HCC) further can demodulate a current modulated signal received via the signal wire from the client communication circuit. The client communication circuit is configured to detect the significant voltage change in order to generate respective sync pulses in a sync signal, which is used to generate a client clock signal. A current modulation is performed by the client communication circuit based on the data to be transmitted a predetermined settling time after one of the sync pulses until the respective following sync pulse.

Host communication circuit, client communication circuit, communication system and communication method

A semiconductor arrangement has a semiconductor body (CP), comprising a semiconductor layer (HL) with a first (AB, AB) and at least one second (AB, AB) conducting terminal areas, respectively made in two parts, and with a first (TAB) and a second (TAB) test terminals; a first (KI, KU) and at least one second (KI, KU) contact areas, located on the semiconductor body (CP) and made of two parts, which are connected with the respective terminal areas (AB, AB; AB, AB), and a first (TK) and a second (TK) test contact areas that are connected with the respective test terminal areas (TAB, TAB); a first terminal () that can be arranged on the semiconductor body (CP) and that contacts both parts of the two-part first contact areas (KI, KU), and at least one second terminal () that can be placed on the semiconductor body (CP) and that contacts both parts of the at least one second two-part contact area (KI, KU), and a first () and a second () test terminals, which can be arranged on the semiconductor body (CP). Moreover, a method is provided for the measurement of a resistance.

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Graz, Austria

Alexander Costa