Kromek Limited

Kromek Group, Plc

Alexander Cherlin

Ian Radley

James William Hugg

A method of detecting radiation from a source and a radiation detection system embodying the principles of the method are described. The method comprises: positioning a detector to receive radiation from the source; applying a multiplexing transformation to radiation from the source to create complexity in three dimensions in the pattern of radiation from the source; receiving a plurality of responses each being a response to an interaction with incident radiation occurring within the detector; determining, for each of the plurality of responses, a characteristic of the interaction, wherein the characteristic comprises at least a position in three dimensions of the interaction within the detector; processing the said plurality of responses in accordance with the determined position in three dimensions of each interaction within the detector and drawing inferences therefrom regarding the pattern of radiation from the source.

Radiation detection system

A method of fabricating a semiconductor detector device to exhibit a target sensitivity to incident radiation in a predetermined energy range is described, the method comprising: providing a semiconductor detector; defining on a detector surface of the semiconductor detector a large plurality of pixels; wherein the detector is geometry is controlled with reference to the size of the said pixels such that a single interaction event in the predetermined energy range will produce a detectable signal in each of a plurality of adjacent pixels making up a cluster of at least three pixels. A detector fabricated by such a method and a method of obtaining spectral information about incident radiation using such a detector are also described.

Semiconductor detector geometry

One embodiment provides a method, including: receiving a plurality of responses to an interaction occurring within a photon detector pixel array, wherein the photon detector pixel array comprises a plurality of pixels; identifying a subset of the plurality of pixels associated with the interaction, wherein each of the subset of the plurality of pixels corresponds to at least one of the plurality of responses; determining, from the plurality of responses, a characteristic of the interaction, wherein the characteristic comprises at least one of: time, position, and energy of the interaction; recording the interaction associated with the at least one determined characteristic; collecting a plurality of recorded interactions and associated determined characteristics; selecting a subset of the plurality of recorded interactions, wherein the subset selection is based upon a restricted range of at least one determined characteristic; and forming an image from the selected subset of the plurality of recorded interactions. Other aspects are described and claimed.

Interaction characteristics from a plurality of pixels

One embodiment provides a method, including: receiving a plurality of responses to an interaction occurring within a photon detector pixel array, wherein the photon detector pixel array comprises a plurality of pixels; identifying a subset of the plurality of pixels associated with the interaction, wherein each of the subset of the plurality of pixels corresponds to at least one of the plurality of responses; and determining, from the plurality of responses, a characteristic of the interaction, wherein the characteristic comprises at least one of: time, position, and energy of the interaction. Other aspects are described and claimed.

Growing community of inventors

Newcastle upon Tyne, United Kingdom

Alexander Cherlin