Rohde and Schwarz Gmbh & Co. Kg

Alexander Breitenfeld

Luke Cirillo

Andreas Lagler

The present disclosure relates to a method () for characterizing a wideband RF device-under-test (DUT) by means of a narrowband RF source or a narrowband RF receiver, the method () comprising: selecting () a bandwidth of the wideband RF DUT to be analyzed; dividing () the selected bandwidth into at least two overlapping sub-bands, the respective sub-bands having a frequency range that corresponds to a bandwidth of the narrowband RF source or the narrowband RF receiver; acquiring () a response of the wideband RF DUT for each of the at least two overlapping sub-bands by means of at least two narrowband measurements using the narrowband RF source or the narrowband RF receiver; and calculating () a continuous amplitude response and a continuous phase response of the wideband RF DUT in a frequency range that corresponds to the combined bandwidth of the at least two overlapping sub-bands, said calculation making use of the overlap of the sub-bands.

Wideband frequency response characterization with a narrowband source or receiver

A method for determining phase noise in a periodically modulated signal is described. The modulated signal is processed to generate a processed signal from the modulated signal. At least an approximate period of a modulation of the modulated signal is determined from the processed signal. The type of modulation of the modulated signal is determined from the processed signal. The modulated signal is demodulated based on the determined period and the determined type of modulation to generate a demodulated signal, and the phase noise is determined from the demodulated signal. Moreover, a measurement device is described.

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Munich, Germany

Alexander Breitenfeld