Harvard College

The Charles Stark Draper Laboratory, Inc.

Alexander Arthur High

Hongkun Park

Robert C Devlin

Federico Capasso

Mohammadreza Khorasaninejad

Mikhail D Lukin

Soonwon Choi

Alexander S Zibrov

David Patterson

Vladimir Manucharyan

Shimon Jacob Kolkowitz

Arthur Safira

Quirin P Unterreithmeier

A method of fabricating a visible spectrum optical component includes: providing a substrate; forming a resist layer over a surface of the substrate; patterning the resist layer to form a patterned resist layer defining openings exposing portions of the surface of the substrate; performing deposition to form a dielectric film over the patterned resist layer and over the exposed portions of the surface of the substrate, wherein a top surface of the dielectric film is above a top surface of the patterned resist layer; removing a top portion of the dielectric film to expose the top surface of the patterned resist layer and top surfaces of dielectric units within the openings of the patterned resist layer; and removing the patterned resist layer to retain the dielectric units over the substrate.

Atomic layer deposition process for fabricating dielectric metasurfaces for wavelengths in the visible spectrum

A method of making measurements includes providing a sensor with at least one solid state electronic spin; irradiating the sensor with radiation from an electromagnetic radiation source that manipulates the solid state electronic spins to produce spin-dependent fluorescence, wherein the spin-dependent fluorescence decays as a function of relaxation time; providing a target material in the proximity of the sensor, wherein, thermally induced currents (Johnson noise) present in the target material alters the fluorescence decay of the solid state electronic spins as a function of relaxation time; and determining a difference in the solid state spins spin-dependent fluorescence decay in the presence and absence of the target material and correlating the difference with a property of the sensor and/or target material.

Sensor for measurements using Johnson noise in materials

Growing community of inventors

Cambridge, MA, United States of America

Alexander Arthur High