Infineon Technologies Ag

Alessandro Michelutti

Mario Motz

Simon Hainz

Bernhard Schaffer

Wolfgang Horn

Umberto Aracri

An integrated circuit includes a first bandgap voltage reference sub-circuit configured to provide a first bandgap reference voltage; a second bandgap voltage reference sub-circuit configured to provide a second bandgap reference voltage; a voltage regulator sub-circuit configured to derive a first supply voltage using the first bandgap reference voltage and a second supply voltage using the second bandgap reference voltage; a bandgap comparator sub-circuit configured to derive a first internal voltage and a second internal voltage from the first supply voltage, wherein the first internal voltage decreases at a higher rate than the second internal voltage with respect to a decreasing first supply voltage, wherein the bandgap comparator sub-circuit is configured indicate which of the first and the second internal voltages is larger; and a comparator sub-circuit configured to indicate whether a difference between the first supply voltage and the second supply voltage is larger than a predefined threshold.

Electric devices, integrated circuits, and methods for monitoring voltages

An electrical device includes a power supply circuit configured to provide a first voltage and a second voltage, and a first verification circuit configured to derive a first and a second internal voltage from the first voltage, to compare the first and second internal voltages, and to generate a first output signal based on the comparison. The electrical device includes a second verification circuit including a first input terminal for the first voltage and a second input terminal for the second voltage, and configured to compare the first and second voltages and to generate a second output signal based on the comparison. Furthermore, the electrical device includes a combination circuit configured to generate a third output signal if the first output signal or the second output signal is indicative of the first voltage or the second voltage being outside a tolerance range.

A circuit for obtaining information on a physical quantity according to an embodiment includes a sensor arrangement sensitive to the physical quantity, at least one further sensor element sensitive to the physical quantity and a supply circuit configured to provide the sensor arrangement with a supply signal comprising a supply voltage controlled by the supply circuit in a closed-loop configuration. The supply circuit is further configured to provide the at least one further sensor element with a further supply signal comprising a further supply current such that a magnitude of the further supply current fulfills a predetermined relationship with a magnitude of a supply current of the supply signal. As a consequence, it may be possible to improve a trade-off between an improved compensation of variations, simplifying an implementation, simplifying the manufacturing, simplifying the sensing and providing stable sensing conditions.

Circuit, method and sensor for obtaining information on a physical quantity

A sensor operates to produce a differential signal with a voltage regulated that generates a regulated voltage to a first sensor element for detecting a physical parameter. A current mirror circuit is configured to provide a first sensor current to the first sensor element, detect the first sensor current at the first sensor element and duplicate the detected current to provide a second sensor current to a second sensor element. The second sensor element detects the physical quantity with the replicated current.

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Villach, Austria

Alessandro Michelutti