Anton Paar Gmbh

Alberto Gomez-Casado

Daniel Koller

Markus Brandner

Norbert Rath

Martin Godec-Schönbacher

A scanning probe microscope analyses a sample by moving a probe and the sample relative to one another. The scanning probe microscope includes a detection unit for detecting an image of a gap between the sample and the probe in a substantially horizontal side view.

Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view

A scanning probe microscope, in particular an atomic force microscope, for analyzing a sample by moving a probe and the sample relative to one another, wherein the scanning probe microscope includes a detection unit with a side view camera arranged and configured for detecting an image of the sample in a substantially horizontal side view, and a determining unit for determining information indicative of a profile of at least part of a surface of the sample based on the detected image.

Characterizing a height profile of a sample by side view imaging

A fixing device selectively fixes a measuring probe of a scanning probe microscope. The fixing device comprises an inserting unit in which the measuring probe is insertable and a master force unit for selectively exerting a master force onto a fixing mechanism. The fixing mechanism is actuatable without a tool. The fixing mechanism is enabled or disabled to controllably detach or fix the measuring probe when the measuring probe is inserted in the inserting unit.

Growing community of inventors

Seiersberg-Pirka, Austria

Alberto Gomez-Casado