Growing community of inventors

San Jose, CA, United States of America

Alberto Calderon

Average Co-Inventor Count = 4.80

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 22

Alberto CalderonDonald Paul Richmond, Ii (10 patents)Alberto CalderonScott E Lindsey (10 patents)Alberto CalderonKenneth W Deboe (10 patents)Alberto CalderonSteven C Steps (10 patents)Alberto CalderonJovan Jovanovic (2 patents)Alberto CalderonDavid S Hendrickson (2 patents)Alberto CalderonBradley R Gunn (2 patents)Alberto CalderonDonald P Richmond (0 patent)Alberto CalderonAlberto Calderon (12 patents)Donald Paul Richmond, IiDonald Paul Richmond, Ii (54 patents)Scott E LindseyScott E Lindsey (50 patents)Kenneth W DeboeKenneth W Deboe (33 patents)Steven C StepsSteven C Steps (22 patents)Jovan JovanovicJovan Jovanovic (56 patents)David S HendricksonDavid S Hendrickson (16 patents)Bradley R GunnBradley R Gunn (2 patents)Donald P RichmondDonald P Richmond (0 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Aehr Test Systems, Inc. (12 from 87 patents)


12 patents:

1. 10976362 - Electronics tester with power saving state

2. 10718808 - Electronics tester with current amplification

3. 10151793 - Electronics tester with double-spiral thermal control passage in a thermal chuck

4. 9857418 - Electronics tester with group and individual current configurations

5. 9500702 - Electronics tester with hot fluid thermal control

6. 9291668 - Electronics tester with a valve integrally formed in a component of a portable pack

7. 9086449 - Adhesively attached stand-offs on a portable pack for an electronics tester

8. 8198909 - Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion

9. 7902846 - Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion

10. 7667475 - Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion

11. 7063544 - System for burn-in testing of electronic devices

12. 6815966 - System for burn-in testing of electronic devices

Please report any incorrect information to support@idiyas.com
idiyas.com
as of
12/29/2025
Loading…