Intel Corporation

Lsi Corporation

Agere Systems Inc.

Avago Technologies General IP (singapore) Pte. Ltd.

Massana Research Limited

Albert Molina

Kameran Azadet

Matteo Camponeschi

Ramon Sanchez

Samer Lutfi Hijazi

Martin Clara

Christian Lindholm

Joseph H Othmer

Daniel Gruber

Meng-Lin Yu

Sunitha Kopparthi

Shilpa Talwar

Hosein Nikopour

Bryan K Casper

Ofir Degani

Wook Bong Lee

Ashoke Ravi

Michael Genossar

Claudio Da Silva

Stefano Pellerano

Debabani Choudhury

Rotem Banin

Sidharth Dalmia

Georgios Yorgos Palaskas

Igal Kushnir

Duncan Kitchin

Oner Orhan

Saku Lahti

Joseph Williams

Emanuel Cohen

Gadi Shor

Mikko S Komulainen

Jayprakash Thakur

Eren Sasoglu

Arnaud Lucres Amadjikpe

Giacomo Cascio

Kunal Datta

Menashe Soffer

Ana M Yepes

Moshe Teplitsky

Omer Asaf

Run Levinger

Chintan S Thakkar

Eshel Gordon

Josef Hagn

Nebil Tanzi

Erkan Alpman

Hundo Shin

Ron Pongratz

Tawfiq Musah

Baljit Singh

Peter Sagazio

Eyal Goldberger

Amit Freiman

Shuhei Yamada

Kaushik Dasgupta

Eran Gerson

Yossi Tsfati

Shmuel Ravid

Nir Weisman

Marian K Verhelst

Meir Gordon

Anandaroop Chakrabarti

Resti Montoya Moreno

Noam Kogan

Naftali Landsberg

Ra'anan Sover

Mikko M Lampinen

Miroslav Baryakh

Avi Tsarfati

Lior Shakedd

Anat Bazov

Stefano Brenna

Saeid Daneshgar Asl

Amr M Fahim

Shinwon Kang

Te Yu Kao

Nathan G Narevsky

Jose Luis Ceballos

Kannan Rajamani

Patrick J Quirk

Carl Murray

Fadi Saibi

Chengzhou Li

Matthew Blaha

Gregory Chance

Ramon Sanchez Perez

Brandon Davis

Jian-Guo Chen

Gregory W Chance

Brandon R Davis

Philip Curran

Brian Paul Murray

Steven Pinault

Parakalan Venkataraghavan

Oisin Ó Cuanacháin

Joe H Othmer

An analog-to-digital converter (ADC) system is provided. The ADC system includes a first signal path. The first signal path includes a first ADC configured to generate first digital data based on an input signal. The first ADC is a time-interleaved ADC including a plurality of sub-ADCs. The first signal path further includes circuitry configured to output activity data indicating at least which of the plurality of sub-ADCs is currently active. The ADC system further includes a correction circuit configured to output digital correction data based on the activity data. Further, the ADC system includes a second signal path coupled in parallel to the first signal path. The second signal path includes a second ADC configured to generate second digital data based on the input signal and a combiner circuit configured to generate modified second digital data by combining the second digital data and the correction data. The ADC system further includes an equalizer configured to generate an equalized output signal of the ADC system based on the first digital data. The equalizer is configured to adjust, based on the modified second digital data, at least one equalization parameter used for generating the equalized output signal of the ADC system.

Analog-to-digital converter system, receiver, base station, mobile device and method for analog-to-digital conversion

A system and method for calibrating a time-interleaved digital-to-analog converter (DAC). A calibration signal generator generates calibration data, and a time-interleaved DAC converts the calibration data to an analog calibration signal. An observation analog-to-digital converter (ADC) samples, and quantizes, the analog calibration signal filtered by an anti-alias filter. A mismatch estimation block estimates a frequency response mismatch between the sub-DACs and generates a sub-DAC mismatch correction factor based on an output of the observation ADC. The calibration signal generator applies the sub-DAC mismatch correction factor to the calibration data. The mismatch estimation block may estimate a DC offset mismatch between the sub-DACs based on the output of the observation ADC and generates a DC offset correction factor, and the calibration signal generator applies the DC offset correction factor to the calibration data.

System and method for calibrating a time-interleaved digital-to-analog converter

An analog-to-digital conversion system. A clock generator generates a first clock signal at a first frequency. An analog-to-digital converter (ADC) converts an input analog signal to a digital signal. The ADC operates based on the first clock signal at the first frequency. A calibration digital-to-analog converter (DAC) generates an analog reference signal from digital reference data. A fractional rate clock generator generates a second clock signal from the first clock signal. The second clock signal is at a second frequency that is a fractional rate of the first frequency, and the calibration DAC operates at the second frequency. An equalizer processes an output of the ADC to remove a distortion incurred by the ADC and a calibration circuitry generates coefficients for the equalizer based on the digital reference data and the output of the ADC to the analog reference signal.

System and method for calibrating an analog-to-digital converter using a rational sampling frequency calibration digital-to-analog converter

Millimeter wave (mmWave) technology, apparatuses, and methods that relate to transceivers, receivers, and antenna structures for wireless communications are described. The various aspects include co-located millimeter wave (mmWave) and near-field communication (NFC) antennas, scalable phased array radio transceiver architecture (SPARTA), phased array distributed communication system with MIMO support and phase noise synchronization over a single coax cable, communicating RF signals over cable (RFoC) in a distributed phased array communication system, clock noise leakage reduction, IF-to-RF companion chip for backwards and forwards compatibility and modularity, on-package matching networks, 5G scalable receiver (Rx) architecture, among others.

Wireless communication technology, apparatuses, and methods

A system and method for equalization of a linear or non-linear system. The system includes an adder configured to add an analog reference signal and an input signal, a processing system configured to process a sum of the analog reference signal and the input signal, a non-linear equalizer (NLEQ) configured to process an output of the processing system to remove a distortion incurred by the processing system, a calibration circuitry configured to generate a reconstructed reference signal in digital domain based on measurement of the analog reference signal, and generate coefficients for the NLEQ based on the reconstructed reference signal and the output of the processing system, and a subtractor configured to subtract the reconstructed reference signal from an output of the NLEQ. The analog reference signal may be a sinusoid including single or multiple tones of sinusoids. The non-linear system may be an analog-to-digital converter (ADC).

Method and system for digital equalization of a linear or non-linear system

An analog-to-digital converter comprising a plurality of sampling cells. At least one of the plurality of sampling cells comprises a capacitive element coupled to a cell output of the at least one of the plurality of sampling cells, wherein a cell output signal is provided at the cell output. The at least one of the plurality of sampling cells further comprises a first cell input for receiving an input signal to be digitized, and a second cell input for receiving a calibration signal. Additionally, the at least one of the plurality of sampling cells comprises a first switch circuit capable of selectively coupling the first cell input to the capacitive element based on a clock signal, and a second switch circuit capable of selectively coupling the second cell input to the capacitive element, wherein a size of the second switch circuit is smaller than a size of the first switch circuit.

Analog-to-digital converter and method for calibrating the same, method for calibrating a pipelined analog-to-digital converter, receiver, base station and mobile device

A digital-to-analog converter is provided. The digital-to-analog converter includes a delay circuit configured to iteratively delay a digital input signal based on a clock signal for generating a plurality of delayed digital input signals. Further, the digital-to-analog converter includes a plurality of groups of inverter cells. Each group of inverter cells is configured to generate a respective analog signal based on one of the plurality of delayed digital input signals. The inverter cells includes a respective inverter circuit configured to invert the respective delayed digital input signal. The plurality of groups of inverter cells include different numbers of inverter cells. The digital-to-analog converter additionally includes an output configured to output an analog output signal based on the analog signals of the plurality of groups of inverter cells.

Digital-to-analog converter, digital-to-analog conversion system, electronic system, base station and mobile device

A method and system for controlling an analog-to-digital converter (ADC) in an observation path in a transceiver. The transceiver includes a transmit path, a receive path, and an observation path. The observation path includes an analog buffer and an observation ADC. A controller generates a control signal to control sampling events at the observation ADC to activate the observation ADC at combined uniform and non-uniform sampling instants. The controller may also generate a second control signal indicating whether digital data obtained by the observation ADC is valid or not. The digital data generated by the observation ADC at non-uniform sampling instants is indicated as invalid and digital data generated by the observation ADC at uniform sampling instants is indicated as valid. The digital data indicated as invalid may be discarded and the digital data indicated as valid is used for calibration of the transmit path or the receive path.

Transceiver and method and system for controlling an analog-to-digital converter in an observation path in the transceiver

A semiconductor chip providing on-chip self-testing of an Analog-to-Digital Converter, ADC, implemented in the semiconductor chip is provided. The semiconductor chip comprises the ADC and a Digital-to-Analog Converter, DAC, configured to generate and supply a radio frequency test signal to the ADC via a supply path. The ADC is configured to generate digital output data based on the radio frequency test signal. The semiconductor chip further comprises a reference data generation circuit configured to generate digital reference data. Additionally, the semiconductor chip comprises a comparator circuit configured to compare the digital output data to the digital reference in order to determine error data.

Semiconductor chip providing on-chip self-testing of an ana-log-to-digital converter implemented in the semiconductor chip

Input circuitry for an analog-to-digital converter (ADC) is provided. The input circuitry includes a calibration signal source configured to output a calibration signal for the ADC and an analog circuitry configured to receive and process an analog input signal for the ADC. The analog circuitry is further configured to generate a combined signal by combining the analog input signal and the calibration signal. The input circuitry further includes a buffer amplifier coupled to the analog circuitry and configured to supply a buffered signal to the ADC based on the combined signal. Further, the input circuitry includes neutralization circuitry configured to generate, based on the calibration signal, a neutralization signal for mitigating an unwanted signal component related to a limited reverse isolation of the analog circuitry. The neutralization circuitry is further configured to supply the neutralization signal to at least one of an input node and an intermediate node of the analog circuitry.

Input circuitry for an analog-to-digital converter, receiver, base station and method for operating an input circuitry for an analog-to-digital converter

A time-interleaved Analog-to-Digital Converter, ADC, system is provided. The time-inter-leaved ADC system includes time-interleaved first and second ADC circuits and a switching circuit. The switching circuit is configured to selectively supply an analog input signal for digitization to at least one of the first ADC circuit, the second ADC circuit or ground, and to selectively supply an analog calibration signal to at least one of the first ADC circuit, the second ADC circuit or ground. Further, the time-interleaved ADC system includes an output circuit configured to selectively generate, based on least one of a first digital signal output by the first ADC circuit and a second digital signal output by the second ADC circuit, a digital output signal.

Time-interleaved analog-to-digital converter system

A n-bit Successive Approximation Register Analog-to-Digital Converter, SAR ADC, is provided. The SAR ADC comprises a respective plurality of sampling cells for each bit of the n-bit of the SAR ADC. Each sampling cell comprises a capacitive element coupled to a cell output of the sampling cell in order to provide a cell output signal. Further, each sampling cell comprises a first cell input for receiving a first signal, and a first switch circuit capable of selectively coupling the first cell input to the capacitive element. Each cell additionally comprises a second cell input for receiving a second signal, and a third cell input for receiving a third signal. The third signal exhibits opposite polarity compared to the second signal. Each sampling cell comprises a second switch circuit capable of selectively coupling one of the second cell input and the third cell input to the capacitive element. The SAR ADC further comprises at least one comparator circuit coupled to the sampling cells. The at least one comparator circuit is configured to output a comparison signal based on the cell output signals of the sampling cells. Additionally, the SAR ADC comprises a calibration circuit configured to supply at least one respective control signal to the respective second switch circuit of the sampling cells for controlling the second switch circuits.

n-Bit successive approximation register analog-to-digital converter and method for calibrating the same, receiver, base station and mobile device

The present disclosure relates to a time-interleaved ADC circuit. The time-interleaved ADC circuit comprises an input for an analog input signal, a first ADC bank comprising a first plurality of parallel time-multiplexed ADCs, wherein the first plurality of parallel time-multiplexed ADCs is configured to subsequently generate a first plurality of samples of the analog input signal during a first time interval, a first buffer amplifier coupled between the input and the first ADC bank. The time-interleaved ADC circuit further comprises a second ADC bank comprising a second plurality of parallel time-multiplexed ADCs, wherein the second plurality of parallel time-multiplexed ADCs is configured to subsequently generate a second plurality of samples of the analog input signal during a second time interval, wherein the first and the second time intervals are subsequent time intervals, a second buffer amplifier coupled between the input and the second ADC bank. The first ADC bank has associated therewith a first dummy sampler, wherein the ADC circuit is configured to activate the first dummy sampler before the start of the first time interval. The second ADC bank has associated therewith a second dummy sampler, wherein the ADC circuit is configured to activate the second dummy sampler before the start of the second time interval.

Apparatus and method for time-interleaved analog-to-digital conversion

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Novelda, Spain

Albert Molina