Ati Technologies Inc.

Albert Man

Roy Schoonover

Lee K Lau

Raymond P C Wong

Sam Ho

Systems and methods are provided for testing a device. A test fixture is provided for interfacing a device with a host system for generating tests to be run on the device. The device is placed in a scan-test mode, according to a built-in self-test of the device. A scan clock signal and scan pattern are provided to allow scan-tests to be run on the device. If the device passes the scan test, the device is placed in a real-time test mode. At-speed tests may then be run on the device to provide a robust test and identify portions of the device that may be faulty.

System and method for testing video devices using a test fixture

A system and method for testing multiple components using a single host system is shown and described. A host system with a single advanced graphics port (AGP) is used to generate commands of a test routine to test a particular type of AGP processing component. A test fixture interfaces to the AGP port of the host system and provides the commands to each of a plurality of test components. The test components process the commands concurrently, generating results. The test fixture receives each of the results in turn and provides the results to the host system, allowing the host system to determine if the test components are functioning within particular parameters. The test fixture provides an interface to allow several test components to be tested as AGP master devices, over a single AGP port on the host system.

System for testing multiple devices on a single system and method thereof

A method and apparatus for testing specific assembled circuits begins by configuring a plurality of applications specific testing entities to test assembled circuits, where the configuring is based on the types of assembled circuits being tested. Next, a specific assembled circuit testing program is provided to the corresponding application specific testing entity based on the type of assembled circuits it is testing. In addition to providing the testing programs to the testing entities, programming instructions are provided to a programmable handler to pick and place the appropriate assembled circuits with the corresponding applications specific testing entities. When the testing of a particular assembled circuit is complete, a test complete indication is provided. When the test complete indication is received by the host, programming instructions are provided to the programmable handler to remove the integrated circuit from the testing entity and place another integrated circuit in the proximity of the testing entity for subsequent testing.

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Richmond Hill, Canada

Albert Man