Tandem Computers Incorporated

Albert Jordan

David J Garcia

Peter L Fu

Daniel E Lenoski

Disclosed is a circuit configuration that permits the monitoring of the operation of an input/output circuit of a digital unit under test by pseudo-random scan test techniques. A resistive element couples test signals to an input/output terminal of the device under test to which the input/output circuit is connected. The connection between the resistive element and the terminal is monitored during pseudo-random scan testing, permitting testing of the input/output circuitry.

Pseudo-Random scan test apparatus

A system for folding the address space of a reserved segment of a high speed memory into a designated part of the address space of a cache memory included in the high speed memory. Folding information for distinguishing between cache entries that have been folded from reserved segments and those that normally map into a designated segment of the high speed memory is stored. The folding information is utilized to determine whether a cache miss occurs when the designated segment of the cache memory is accessed.

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Mountain View, CA, United States of America

Albert Jordan