Lltech Management

Centre National De La Recherche Scientifique

Ecole Superieure De Physique Et De Chimie Industrielles De La Ville De Paris

The United States of America, As Represented by the Secretary, Department of Health and Human Services

Institut National De La Sante Et De La Recherche Medicale

Université Pierre Et Marie Curie

Centre National De La Recherche Scientifique-cnrs

Ecole Normale Superieure

Paris Sciences Et Lettres

Paris Sciences Et Lettres-quartier Latin

Sorbonne Université

Inserm (institut National De La Sante Et De La Recherche Medicale)

Ecole Normale Superieure De Paris

Albert Claude Boccara

Fabrice Harms

Bertrand Le Conte Chrestien De Poly

Mathias Fink

Paul D Smith

Amir H Gandjbakhche

Christian Bergaud

Victor Chernomordik

Marie-Claude Potier

Jean-Paul Roger

Alexander Sviridov

Egidijus Auksorius

Peng Xiao

Viacheslav Mazlin

Pedro Francisco Baracal De Mece

Bertrand Le Conte De Poly

Anne Latrive

Zachary Ulissi

Moinuddin Hassan

Martine Boccara

Olivier Thouvenin

A full-field optical coherence tomography imaging method, FFOCT, using a system comprising an FFOCT device and a sample, the sample comprising a layer of interest to be imaged, the FFOCT device comprising an incoherent light source, an imager, a beam splitter defining a sample arm and a reference arm, the method comprising—generating sample light containing interest light originating from the layer of interest and reference light traveling from the reference arm, —acquiring an image from reference light and sample light combined in the beam splitter; wherein at least one of the sample arm and the reference arm comprises an optical curvature compensator that modifies a transverse variation distribution of an optical path length to match the transverse variation distributions of the optical path lengths travelled by the reference light and the interest light incident on the imager.

Full-field optical coherence tomography imaging method

According to one aspect, the invention relates to a system () for in vivo, full-field interference microscopy imaging of a scattering three-dimensional sample. It comprises a full-field OCT imaging system () for providing en face images of the sample, wherein said full-field OCT system comprises an interference device () with an object arm () intended to receive the sample and a reference arm () comprising an optical lens () and a first reflection surface (), and an acquisition device () configured to acquire a temporal succession of two-dimensional interferometric signals (I, I) resulting from interferences produced at each point of an imaging field; an OCT imaging system () for providing at the same times of acquisition of said two-dimensional interferometric signals, cross-sectional images of both the sample and a first reflection surface () of said full-field OCT imaging system (); a processing unit () configured to determine a plurality of en face images (X-Y) of a plurality of slices of the sample, each en face image being determined from at least two two-dimensional interferometric signals (I, I) having a given phase shift; determine from the cross-sectional images provided by the OCT imaging system () at the times of acquisition of each of said two two-dimensional interferometric signals (I, I) a depth (z) for each en face image (X-Y) of said plurality of slices; determine a 3D image of the sample from said plurality of en face images of said plurality of slices of the sample and depths.

Methods and systems for in vivo full-field interference microscopy imaging

A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals.

Method and system for full-field interference microscopy imaging

A system for the full-field interferential imaging of a sample, includes an illumination path with a light source, an interferometer with at least one first objective, and a separating element for receiving incident light waves via an input face and for forming an object arm for receiving the sample and a reference arm on which a reflection device is arranged, the reflection device being used to reflect incident light waves in a direction different from the direction of incidence. The separator element has a reflection coefficient and a transmission coefficient that are non-equal such that the proportion of the optical power of the incident light waves sent to the object arm is strictly larger than the proportion of the optical power of the light waves sent to the reference arm. The system also comprises a detection path comprising a two-dimensional image acquisition device, the illumination path and the detection path comprising a common path comprising\input face of the separator element and being separated by a reflection element.

Full-field interferential imaging systems and methods

The invention relates to a system () for full-field interference microscopy imaging of a three-dimensional diffusing sample (). Said system includes: &#x2014;an interference device () including a reference arm on which a reflective surface () is arranged, the interference device being suitable for producing, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave, obtained by reflection of incident light waves onto a basic surface of the reflective surface () corresponding to said point of the imaging field, and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth, said voxel corresponding to said point of the imaging field; &#x2014;an acquisition device () suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and &#x2014;a processing unit () configured to calculate an image (IB, IC) representing temporal variations in intensity between said N two-dimensional interferometric signals.

A device for optically detecting in transmission nanoparticles moving in a fluid sample includes a light source for emitting a spatially incoherent beam for illuminating the sample; an imaging optical system; and a two-dimensional optical detector. The imaging optical system includes a microscope objective. The two-dimensional optical detector includes a detection plane conjugated with an object focal plane of the microscope objective by said imaging optical system. The two-dimensional optical detector allows a sequence of images of an analysis volume of the sample to be acquired, each image resulting from optical interferences between the illuminating beam incident on the sample and the beams scattered by each of the nanoparticles present in the analysis volume during a preset duration shorter than one millisecond. The device further includes an image processor that allows an average of a sequence of said images to be taken and said average to be subtracted from each image in order to determine, for each nanoparticle of the analysis volume, the amplitude of the scattered beam.

Method and device for optically detecting nanoparticles in a fluid sample

A polarization-based colposcopy apparatus includes a polarization exchanging beam splitter pair oriented so that s- and p-polarizations are exchanged. An optical flux from a specimen is directed through the pair, and orthogonal components thereof are alternately or selectively coupled to an array detector. The detected images are processed based on image correlations to reveal specimen structures.

Polarimetric accessory for colposcope

A device for three-dimensional imaging by full-field interferential microscopy of a volumic and scattering sample includes an imaging interferometer of variable magnification, allowing for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of the incident wave on a reference mirror and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of the sample. The invention also relates to a processing unit that processes the interferometric images, a unit for axially displacing the interferometer relative to the sample for the acquisition of tomographic images for slices at different depths of the sample, and a unit for varying the magnification of the imaging interferometer for the acquisition of interferometric images of a slice for different magnification values.

Method and device for high resolution full field interference microscopy

According to a first aspect, the invention relates to a multimodal optical sectioning microscope () for full-field imaging of a volumic and scattering sample comprising: &#x2014;a full-field OCT system for providing an image of a first section in depth of the sample comprising an illumination sub-system () and a full-field imaging interferometer with a detection sub system () and an optical conjugation device for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises a microscope objective (), &#x2014;a supplementary full-field optical sectioning imaging system for providing a fluorescent image of a second section in depth of said sample comprising a structured illumination microscope with an illumination sub system (), means () for generating at the focal plane of said microscope objective of said full-field imaging interferometer a variable spatial pattern illumination and a detection sub system (), optically conjugated with said focal plane of the microscope objective.

Optical tissue sectioning using full field optical coherence tomography

The present invention relates to a full-field optical coherence tomography system () for imaging an object (), comprising a light source (), a first interferometric device having means for splitting an input light beam and comprising at least a reflecting surface (), a second interferometric device having means for splitting the spectrally modulated output beam and comprising at least a reflecting surface, a multichannel acquisition device (), the system () being characterized in that at least one of the interferometric devices includes at least a focusing optical element arranged to focus at least one of the input beams or at least one of the output beams onto the corresponding reflecting surface of the corresponding interferometric device.

Full-field optical coherence tomography system for imaging an object

The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (). The device comprises an interference device () between a reference wave (), produced by reflection of an incident wave by a reflective surface () of a reference arm of the interference device, and an object wave () produced by backscattering of the incident wave by a slice of the sample, an acquisition device () for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit () for calculating an image of the slice of the sample, based on said interference signals. The interference device also comprises an optical element () for modifying the phase of the wavefront, and the microscopy device comprises a control unit () for the optical element, linked to the processing unit (), the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.

The invention concerns an apparatus for parallel detection of the behaviour of mechanical micro-oscillators interacting with the sample (). The amplitude and the phase of resonance of micro-oscillators () are measured with optical means. The invention is characterised in that a source () is active during a fraction 1/n of the period (n being an integer) and of variable phase p/n of the period (p being an integer). Interferences are produced between light beams generated by reflection of incident light beams () and () on the micro-oscillators (). Periodically the micro-oscillators () are displaced by means. The value of the parameter p (p being an integer) is varied and N elementary measurements are integrated to obtain a measurement representing each of the values of p. The phase and amplitude of each micro-oscillator () are calculated on the basis of the representative data obtained for each value of p and this for a large number of accumulations. The invention is applicable in the field of nanotechnologies.

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Paris, France

Albert Claude Boccara