Sv Probe Pte. Ltd.

Alan Slopey

Bahadir Tunaboylu

Horst Clauberg

Edward T Laurent

Edward Lambert Malantonio

John McGlory

Scott R Williams

John Shuhart

Guy Frick

Bruce Griffing

Robert E Werner

Paul Bereznycky

A method and apparatus for repairing a probe on a probe card is provided. A plurality of beams is formed on a beam panel. The plurality of beams includes a replacement beam. After identifying a damaged beam on the probe card, the damaged beam is removed from the probe card. The beam panel is aligned with the probe card. After the beam panel is aligned, the aligned beam panel is temporarily affixed to the probe card. After the beam panel is temporarily affixed to the probe card, the replacement beam is affixed at a location previously occupied by the damaged beam. After the replacement beam is affixed at the location, the beam panel is removed from the probe card.

Probe repair methods

A probe for a probe card assembly is provided. The probe includes a beam element having a tip end portion. The probe also includes a tip structure on the tip end portion of the beam element. The tip structure includes a plurality of conductive bumps arranged in a stacked configuration.

Stacked tip cantilever electrical connector

Growing community of inventors

Warrington, PA, United States of America

Alan Slopey