Rockwell Collins, Inc.

Alan P Boone

Ross Keith Wilcoxon

Nathan P Lower

Brandon C Hamilton

Guy N Smith

Reginald D Bean

Nathaniel P Wyckoff

Kyle B Snyder

David D Hillman

Bret W Simon

James R Wooldridge

Steven John Wiebers

Mark T Dimke

Marty B McGregor

Bryan M Jefferson

Sarah M Shepard

An electrical device with thermally controlled performance is disclosed. The electrical device includes at least one die with a plurality of device components disposed upon or at least partially embedded within the die. The electrical device further includes a plurality of signal paths interconnecting the plurality of device components. The electrical device further includes a plurality of temperature sensors disposed upon or at least partially embedded within the die. The temperature sensors are configured to detect thermal loads at respective portions of the die. The electrical device further includes at least one controller disposed upon or at least partially embedded within the die. The controller is configured to adjust one or more operating parameters for one or more of the device components based on the thermal loads detected by the temperature sensors.

Electrical device with thermally controlled performance

An electrical device with printed interconnects between packaged integrated circuit components and a substrate as well as a method for printing interconnects between packaged integrated circuit components and a substrate are disclosed. An electrical device with printed interconnects may include a dielectric layer forming a continuous surface between a substrate and a terminal face of an integrated circuit component. The electrical device may further include interconnects formed from a layer of material printed across the continuous surface formed by the dielectric layer to connect electrical terminals on the substrate to electrical terminals on the terminal face of the integrated circuit component.

Microfluidic manufactured mesoscopic microelectronics interconnect

A system-in-package (SIP) incorporating die-in-die cavity packaging may include hybrid dies fabricated by milling or otherwise creating a cavity through the additive surfaces of a primary application specific integrated circuit (ASIC) die configured for flip-chip bonding and encapsulating a secondary die such as a Flash/non-volatile memory module, analog-digital converter (ADC), or other processing circuit into the cavity. The primary and secondary dies are then connected by the addition of redistribution layers. The resulting hybrid die may then be vertically integrated into the SIP along with additional memory modules or dies.

Die-in-die-cavity packaging

An interposer and a method for stacking dies utilizing such an interposer in an integrated circuit are disclosed. The interposer includes a substrate and a plurality of vias defined in the substrate. At least one of the plurality of vias of the interposer is positioned to establish a connection with at least one of the plurality of vias of a first die. At least one additional die is positioned to establish a connection with the first die utilizing the connection established between the interposer and the first die through at least one of the vias.

Flip chip stacking utilizing interposer

A coating for reducing interaction between a surface and the environment around the surface includes an alkali silicate glass material configured to protect the surface from environmental corrosion due to water or moisture. The alkali silicate glass material is doped with a first element to affect various forms of radiation passing through the coating. The electromagnetic radiation is at least one of ultraviolet, x-ray, atomic (gamma, alpha, beta), and electromagnetic or radio wave radiation. The coating may also be used to protect a solar cell from the environment and UV rays while retransmitting received light as usable light for conversion into electrical energy. The coating may also be used to prevent whisker formation in metal finishes of tin, cadmium, zinc, etc.

Alkali silicate glass based coating and method for applying

An electromagnetic interference (EMI) shielded device and a method for making an EMI shield device are disclosed. The EMI shielded device may include an electrical circuit and an encapsulation layer disposed on a portion of the electrical circuit. The encapsulant layer having a plurality of particles dispersed therein, wherein the plurality of particles are suitable for shielding electrical circuitry from EMI. The method for making an EMI shielded device may include providing an electrical circuit, and depositing an encapsulant material upon a portion of the electrical circuit, wherein a plurality of EMI shielding particles are dispersed within the encapsulant material. An additional method may include depositing a dielectric material upon a portion of the electrical circuit and depositing an encapsulant material upon a portion of the dielectric material and the portion of the electrical circuit, wherein a plurality of EMI shielding particles are dispersed within the encapsulant material.

Shielding encapsulation for electrical circuitry

An electronics package includes a substrate and at least one electronic component coupled to the substrate. The electronics package comprises an alkali silicate coating forming a hermetic seal around at least a portion of the at least one electronic component.

Integrated circuit protection and ruggedization coatings and methods

The present invention is a method for providing an integrated circuit assembly, the integrated circuit assembly including an integrated circuit and a substrate. The method includes mounting the integrated circuit to the substrate. The method further includes, during assembly of the integrated circuit assembly, applying a low processing temperature, at least near-hermetic, glass-based coating directly to the integrated circuit and a localized interconnect interface, the interface being configured for connecting the integrated circuit to at least one of the substrate and a second integrated circuit of the assembly. The method further includes curing the coating. Further, the integrated circuit may be a device which is available for at least one of sale, lease and license to a general public, such as a Commercial off the Shelf (COTS) device. Still further, the coating may promote corrosion resistance and reliability of the integrated circuit assembly.

Method for providing near-hermetically coated integrated circuit assemblies

A method of protecting an electronics package is discussed along with devices formed by the method. The method involves providing at least one electronic component that requires protecting from tampering and/or reverse engineering. Further, the method includes mixing into a liquid glass material at least one of high durability micro-particles or high-durability nano-particles, to form a coating material. Further still, the method includes depositing the coating material onto the electronic component and curing the coating material deposited.

Integrated circuit tampering protection and reverse engineering prevention coatings and methods

The present invention is directed to use of a polyamide thermal plastic as a potting compound for potting electronic components (ex.&#x2014;printed circuit boards) of an electronics assembly which is implemented in a munition. Use of the polyamide thermal plastic as a potting compound allows for a gun-hardened electronics assembly. Use of the polyamide thermal plastic as a potting compound also allows for reworkability. For example, during early testing phases of the electronics assembly, the potting material of the present disclosure may be removable (ex.&#x2014;such as via a hot solvent bath) from the electronics assembly so that the electronics components may be: examined to determine the cause(s) for low yield during testing; and/or fixed, rather than having to rebuild the entire electronics assembly, thereby promoting lower costs of producing the electronics assembly.

Use of polyamide thermal plastics as low cost electronics potting compounds for munitions applications

An assembly includes an integrated circuit die coupled to another component of the assembly with an alkali silicate glass material. The alkali silicate material may include particles for modifying the thermal, mechanical, and/or electrical characteristics of the material.

Adhesive applications using alkali silicate glass for electronics

A method for forming an embedded passive device module comprises depositing a first amount of an alkali silicate material, co-depositing an amount of embedded passive device material with the amount of alkali silicate material; and thermally processing the amount of alkali silicate material and the amount of embedded passive device material at a temperature sufficient to cure the amount of alkali silicate material and the amount of embedded passive device material and form a substantially moisture free substrate.

Glass thick film embedded passive material

An integrated circuit assembly (ex.&#x2014;a flip chip package, a wire bond chip package) is provided which includes a substrate (ex.&#x2014;a printed circuit board) and a die assembly. The die assembly includes an integrated circuit chip which is connected to the printed circuit board. Further, an external dielectric layer (ex.&#x2014;a solder mask layer) of the printed circuit board is at least substantially coated with a conductive coating (ex.&#x2014;a low sintering temperature, nano-particle silver coating). The conductive coating is not in contact with the die assembly and/or passive electronics which are connected to the printed circuit board, however the conductive coating is electrically connected to the printed circuit board. The conductive coating provides (ex&#x2014;acts as) an external ground plane for the printed circuit board.

Growing community of inventors

Swisher, IA, United States of America

Alan P Boone