Huntron, Inc.

Pioneering Decisive Solutions, Inc.

Alan Howard

James M Graverholt

William I Birurakis

Mahesh P Parshotam

Bradley D Grams

A dual functioning apparatus that serves as a cover for a vehicle and as a shelter, which is easily converted and positioned off the back of the vehicle and is attached to the top back cross roll bar of the vehicle for storage.

Dual mode jeep cover

The probe assembly operates with a circuit board test apparatus and includes a main test probe and a secondary test probes. The probe assembly is capable of moving in X, Y and Z directions relative to a circuit board being tested (UUT). The two test probes are movable linearly relative to each other and rotatable together so as to accurately locate the two probes on selected pins on the UUT, for receiving signals from the selected pins, The received signals are transmitted to a display apparatus.

Probe assembly with two spaced probes for high frequency circuit board test apparatus

The system includes a positioning system for mounting the circuit board to be tested and for mounting a sensor assembly. A control system registers the position of the sensor assembly relative to the circuit board to be tested and for moving the sensor assembly about the circuit board. The sensor assembly detects noise or other emissions generated by the circuit elements on the board. The noise emissions are separate from the operating signals of the circuit. The spectrum analyzer receives the emissions from the sensor assembly and produces frequency spectrum data over a selected frequency range with amplitude information. A processing system then compares the frequency spectrum information with frequency spectrum information from boards known to be good and provides information as to any differences and whether they are in an acceptable tolerance range.

System for fault determination for electronic circuits

The system includes an integrated sequenced arrangement of parametric type instruments, automated guided prober test instruments, and a test instrument system using analog signature analysis for identifying faults in circuit card assemblies, under control of a software system with a mass interconnect system.

System and computer program product for performing comprehensive functional and diagnostic circuit card assembly (CCA) testing

The dual probe assembly is used with a printed circuit board test apparatus. It includes a first, satellite test probe holder for a first, satellite test probe and a motor for rotating the first test probe holder. It further includes a second, main test probe holder for a second, main test probe and a motor for moving the second test probe holder. The first test probe holder can move without affecting the position of the second test probe, while the second test probe holder is connected to the first test probe holder in such a manner that movement of the second test probe holder moves the first test probe holder, wherein both a selected distance between the two test probes and a selected angular orientation therebetween can be achieved.

Growing community of inventors

Everett, WA, United States of America

Alan Howard