Texas Instruments Corporation

Alan Henry Leek

Charles Kasimer Sestok, Iv

Damian M Szmulewicz

Bjoern Oliver Eversmann

Jace Hunter Hall

Matthew Justin Calvo

Anand Ganesh Dabak

Baher S Haroun

Srinath Mathur Ramaswamy

Domingo G Garcia

Ryan Michael Brown

In described examples, an enclosure for circuitry includes a platform, a charge source, a first capacitive plate, a second capacitive plate, and a capacitive sensor. The circuitry is fixedly coupled to the platform. The first capacitive plate is also fixedly coupled to the platform, and either alone, or together with the platform, surrounds a volume containing the circuitry and the charge source, the charge source electrically coupled to and configured to charge the first capacitive plate. The second capacitive plate is fixedly coupled to the platform without touching the first capacitive plate, and either alone, or together with the platform, surrounds the first capacitive plate. The second capacitive plate is configured so that there is an electric potential difference between the first capacitive plate and the second capacitive plate. The capacitive sensor is electrically connected to the first capacitive plate and configured to determine when a capacitance between the first and second capacitive plates is changed.

Tamper detection

A material-discerning device is arranged to include an antenna, a proximity sensor, a band pass filter and a processor. The antenna radiates a radio-frequency signal and a material object is located in the field created by the antenna and near the proximity sensor. Change in the amplitude of the radio-frequency signal due to the presence of the material object is detected by the proximity sensor. The change in amplitude of the radio-frequency signal is stored. The frequency of the radio-frequency signal is changed and the process is repeated until a range of frequencies have been swept and stored. After the range of frequencies has been swept and stored, the processor determines the type of material of the material object using the results of the changes in amplitude of the radio-frequency signals.

Material determination by sweeping a range of frequencies

A system includes a controller to provide at least one control output to an automated system in response to a control command received at a control input of the controller. The control output controls the operation of the automated system based on the control command. A signature analyzer generates the control command to the controller and receives an impedance signature related to a property of a material or object encountered by the automated system. The signature analyzer compares the impedance signature to at least one comparison signature to determine the property of the material or object. The signature analyzer adjusts the control command to the controller to control the operation of the automated system based on the determined property.

Impedance signature analyzer to control automated actions

A material-discerning proximity sensor is arranged to include an antenna that is arranged to radiate a radio-frequency signal. A capacitive sensor is arranged to detect a change in capacitance of the capacitive sensor and to receive the radio-frequency signal. An electrical quantity sensor is arranged to detect a change of the received radio-frequency signal.

Material-discerning proximity sensing

A microcontroller-based system for measuring the impedance of a device under test (DUT), responsive to a square wave stimulus, includes parallel stimulus signal paths, selectable by a switch, that can correspond to different stimulus frequency ranges. At least one of the paths includes an off-chip PLL and integer divider circuit to modify the frequency of the stimulus. A discrete Fourier transform executed by a processor is used to determine the impedance of the DUT at the stimulus frequency. Multiple frequencies can be analyzed at the same time by using a summation circuit and/or by analyzing odd harmonics of the stimulus frequency.

Square-wave-based impedance analysis

A material-discerning proximity sensor is arranged to include an antenna that is arranged to radiate a radio-frequency signal. A capacitive sensor is arranged to detect a change in capacitance of the capacitive sensor and to receive the radio-frequency signal. An electrical quantity sensor is arranged to detect a change of the received radio-frequency signal and a change of a radio-frequency signal at an output of the at least one band pass filter.

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Frisco, TX, United States of America

Alan Henry Leek