Advantest (singapore) Pte Ltd

Verigy (singapore) Pte. Ltd.

Alan D Hart

Edmundo De La Puente

Erik H Volkerink

Kenneth D Karklin

James C Anderson

In one embodiment, a method for testing a plurality of singulated semiconductor die involves 1) placing each of the singulated semiconductor die on a surface of a die carrier, 2) mating an array of electrical contactors with the plurality of singulated semiconductor die, and then 3) performing electrical tests on the plurality of singulated semiconductor die, via the array of electrical contactors.

Methods, apparatus and articles of manufacture for testing a plurality of singulated die

A self-repair system provides resource failure tolerance using an interconnection network that provides interconnection information identifying connections between system resources, redundant resources and ports that are connectable to consumers of the system resources. A controller identifies both defective system resources and the affected sinks connected to the defective system resources from the interconnection network. The controller further identifies compatible resources from the system resources and redundant resources that are capable of replacing the defective system resources for each of the affected sinks from the interconnection network. The controller determines a respective cost associated with each of the compatible resources, and in response to the determined costs, selects at least one of the compatible resources as a replacement resource for each of the defective system resources. The controller further configures the interconnection network to connect the replacement resources to the affected ports instead of the defective system resources.

Self-repair system and method for providing resource failure tolerance

In one embodiment, a resource matrix is provided with a first set of pins, a second set of pins, and at least one programmable switching circuit. The first set of pins electrically couples the resource matrix with a tester resource. The second set of pins electrically couples the resource matrix with a plurality of test areas. The at least one programmable switching circuit selectively couples each one of the first set of pins to different ones of the second set of pins. In one embodiment, the at least one programmable switching circuit includes a set of multiplexers. In another embodiment, the at least one programmable switching circuit includes a set of LIMMS. In another embodiment, a system is disclosed for testing a plurality of test areas with a tester resource and a resource matrix. Methods for routing signals between a tester resource and plurality of test areas are also disclosed.

Growing community of inventors

San Carlos, CA, United States of America

Alan D Hart