Gemplus Card International

Alain Jutard

Maurice Betemps

Francois Dupre

Herve Redarce

In order to count chip cards when they are manufactured, it is chosen to present these chip cards in lots, edgewise, in the field of an X-radiation. A measurement is made of the differential image of attenuation of the X-radiation due to the passage of this X-radiation, on the one hand through the plastic card structure, which is relatively transparent to the X-radiation, and on the other hand through the metallic connection parts of the chips. In the radiological absorption image obtained, a count is made of the number of transitions of the absorption signal. It is shown that the reliability of the counting is greatly improved, as is the security of manipulation.

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Genay, France

Alain Jutard