International Business Machines Corporation

Alain G Rwabukamba

Kirk David Peterson

Andrew A Turner

According to an embodiment, a testing mechanism determines a status of circuits within a chip by analyzing fail signatures on a by-level basis to identify a high probability defect area within the chip. The testing mechanism further determines a whether functionally needed circuitry of the chip intersects with the high probability defect area within the chip and determines the status of the circuits in response to the determining of whether the functionally needed circuitry intersects with the high probability defect area.

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Chittenden, VT, United States of America

Alain G Rwabukamba