International Business Machines Corporation

The University of Texas System

Alaa Elwany

Aly Megahed

Bing Zhang

Mohamed Mohamed

Shubhi Asthana

Samir Tata

Ibrahim Karaman

Raymundo Arroyave

Mohammed Saeed Abuelmakarm Shafae

Raiyan Seede

Luke Johnson

A method for determining alloy processing parameters is provided. Simulated melt pool temperature and melt pool geometries can be used to create an initial printability map based on laser speed and laser power, and the printability map can include regions with potential manufacturing defects. Single-track experiments can be used to calibrate the printability map, to produce a revised printability map. Finally, contour lines representing hatch spacing can also be added to the revised printability map to produce a final printability map that can be used to configure additive manufacturing machinery.

Methods of optimizing 3-D printing parameters for metallic materials

A method, a computer program product, and a system for predicting low-frequency sensor signal predictions using a hierarchical prediction model. The method includes receiving a historical dataset of high-frequency sensor signal data and low-frequency sensor signal data. The method also includes generating a Gaussian process regression model using the historical dataset and sensor parameters and outputting high-frequency sensor signal predictions. The method also includes generating a hierarchical Gaussian process model using the historical dataset and the high-frequency sensor signal predictions and predicting low-frequency sensor signal predictions.

Sensor signal prediction at unreported time periods

A monitoring system for metric data may include devices, each device capable of generating respective metric data. The monitoring system may also include a processor and a memory cooperating therewith. The processor may be configured to monitor the devices via a network to obtain the respective metric data, generate predicted trigger events based on monitoring the devices, and generate a respective adapted monitoring for the devices based upon each predicted trigger event. The processor may also be configured to, upon occurrence of one of the predicted trigger events, implement the respective adapted monitoring to obtain new respective metric data.

Monitoring system for metric data

Growing community of inventors

College Station, TX, United States of America

Alaa Elwany