Freescale Semiconductor,inc.

Nxp Usa, Inc.

Cisco Technology, Inc.

Nxp B.v.

Akshay Kumar Pathak

Garima Sharda

Nidhi Sinha

Dinesh Joshi

Alistair Robertson

Carl Culshaw

Sunny Gupta

Alan Devine

Rakesh Pandey

Pedro Barbosa Zanetta

Ivan Carlos Ribeiro Nascimento

Vivek Singh

Akshat Gupta

Quang Phung

Atul Dahiya

Deepak Mahajan

Adriano Marques Pereira

Aniruddha Gupta

Arpit Gupta

A system-on-chip (SoC) includes a memory, a trust provisioning system, a one-time programmable (OTP) element, and a comparator. The memory is configured to store a first secret key before an execution of a trust provisioning operation. The trust provisioning system is configured to receive an encrypted version of a first set of secure assets and one of a second secret key and an encrypted version of the second secret key, and execute the trust provisioning operation on the SoC to store the first set of secure assets and the second secret key in the OTP element. The comparator is configured to compare the first and second secret keys to generate a valid signal that is indicative of a validation of the trust provisioning operation. The first set of secure assets and a second set of secure assets associated with the SoC are accessible based on the valid signal.

System and method for validating trust provisioning operation on system-on-chip

An access control system controls access to a shared resource for various functional circuits. The access control system can include a comparison circuit, a processing circuit, and a selection circuit. The comparison circuit receives identification data associated with a functional circuit based on a transaction initiated by the functional circuit, and compares the identification data and reference data to generate a select signal. The processing circuit receives error data and response data outputted by the shared resource based on an execution of the transaction, and generates another response data. The selection circuit selects and outputs, based on the select signal, one of the response data outputted by the shared resource and the response data generated by the processing circuit as a transaction response that is to be provided to the functional circuit.

System and method for controlling access to shared resource in system-on-chips

A system-on-chip (SoC) includes a system memory, a memory controller, and a memory management system coupled therebetween. The memory management system is configured to receive, from the memory controller, a first control signal that is indicative of a memory operation associated with the system memory, and output and provide a second control signal to the system memory to control an execution of the memory operation. The second control signal is outputted such that when the memory operation corresponds to a first read operation, the first read operation is executed with the system memory, and when the memory operation corresponds to a first write operation, a second read operation is executed with the system memory followed by the first write operation. Thus, the memory management system prevents memory corruption of the system memory when an asynchronous reset event is detected in the SoC.

System for controlling memory operations in system-on-chips

A system-on-chip (SoC) includes a processor, a built-in self-testing (BIST) circuitry, and an adaptive masking circuitry. The processor generates a sweep enable (SWEN) signal to initiate a self-testing operation of the SoC. The BIST circuitry receives the SWEN signal and generates a set of sweep events, such that a transition of the processor from a low power (LP) mode to an active mode is initiated based on the generation of each sweep event. The BIST circuitry further receives a status signal, and identifies a subset of sweep events at which the transition of the processor from the LP mode to the active mode failed, for generating sweep failure data. The adaptive masking circuitry receives the sweep failure data and generates a mask signal, to prevent a transition of the first processor from the LP mode to the active mode, during a non-testing operation of the SoC.

Built-in self-testing and failure correction circuitry

System and method for detecting clock failure are disclosed. The system includes a pulse train generator, a delay circuit, and a failure detection circuit. The pulse train generator receives an input clock and generates a pulse train including a plurality of pulses aligned with a set of rising edges and a set of falling edges of the input clock. The delay circuit delays the input clock by a first time-interval to generate a first delayed clock. The failure detection circuit receives the pulse train and the first delayed clock from the pulse train generator and the delay circuit, respectively, and generates a clock detection signal that transitions from a first logic state to a second logic state based on a failure in the input clock.

Method and system for detecting clock failure

In an embodiment, an electronic device includes an integrated circuit (IC) having a plurality of power domains, a first regulator coupled to a given power domain, a second regulator coupled to the given power domain, and a switching circuit coupled between the first and second regulators and configured to control an amount of current drawn by the power domain from the first and/or second regulators. In another embodiment, a method includes controlling an impedance of a switching circuit to change an amount of current, the switching circuit coupled to a given power domain of an IC configured to operate in a first mode followed by a second mode, where the switching circuit is coupled to a first regulator configured to provide more power to the IC than a second regulator, and a transition period includes turning off the first regulator and turning on the second regulator.

Power gating techniques with smooth transition

An on-board reset circuit for a system-on-chip (SOC) addresses the problem of meta-stability in flip-flops on asynchronous reset that arises when different power domains or reset domains receive resets from different sources. To ameliorate the problem, a reset signal is asserted and de-asserted while the clocks are gated. The clocks are re-instated for a minimum period of time following assertion (or de-assertion) so that logic having synchronous reset can also receive the reset.

Reset circuitry for integrated circuit

An integrated circuit (IC) operable in functional and debug modes includes a debug enable circuit, a pad control register, a debug circuit, a pad configuration register, and an input/output (IO) pad. The debug circuit receives a functional signal from a circuit monitoring circuit, a reference signal, a debug control signal from the debug enable circuit, and pull-enable control and pull-type select control signals from the pad control register, and generates pull-enable and pull-type select signals. The pad configuration register receives the pull-enable and pull-type select signals and configures the IO pad in one of logic low, logic high, and high impedance states. When the IO pad is in either of the logic high and low states longer than a predetermined time period, then the IO pad indicates that the IC is held in a reset phase of a reset sequence.

Debug circuit for an integrated circuit

A microcontroller operable in a high power mode and a low power unit (LPU) run mode includes primary and LPU domains, primary and LPU mode controllers, and primary and LPU clock generator modules. The primary domain includes a first set of circuits and a first set of cores. The LPU domain includes second and third sets of circuits, a second set of cores, and a switching module. In the high power mode, the switching module connects the first and second sets of cores to at least one of the first, second and third sets of circuits, while in the LPU run mode, the switching module isolates the LPU domain from the primary domain and activates a small microcontroller system (SMS) that includes the LPU domain, the LPU mode controller and the LPU clock generator module. The SMS has further low power modes within the LPU run mode.

Microcontroller with multiple power modes

A power management system permits a small microcontroller subsystem or low power domain to continuously operate while a main subsystem domain is cycling from power on to off. The power management system supports asynchronous domains with common shared peripherals. The asynchronous domains operate as a single entity while in a full power mode with the peripheral and system resources being shared. The system can be used in automotive systems where most of the system is power-gated leaving just a power regulator controller, some counters and an input/output segment alive for wakeup purposes.

Integrated circuit power management

A processor includes a TCU TAP for access of a TCU for running functional tests and a DAP TAP for access of a debugger. A TAP selection module selects reversibly TAP access by default through the TCU TAP when the processor is a bare die, or by default through the DAP TAP when the processor is packaged, the selection of TAP access being reversible by the TCU. The processor also includes a fuse for irreversibly disabling the selection by the TAP selection module of the TAP access by default through the TCU TAP. Functional tests on bare dies are run with a TCU probing the dies through the TCU TAP by default. Packaged engineering samples can be supplied for debugging with the DAP TAP selected by default, but access possible for the TCU through the TCU TAP.

Processor switchable between test and debug modes

A method, a system and a computer programmable product have been provided for arbitrating bus cycles among a plurality of device nodes. Requests for bus grant are received from the device nodes. Each request includes values of one or more arbitration parameters. The requests grouped at a first stage, with two requests in each group. A comparison is performed in each group, based on the values of the one or more parameters. Further, winners from each comparison are forwarded to a next stage. Subsequently, comparisons are performed over one or more stages to select a winner of the bus grant.

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Noida, India

Akshay Kumar Pathak