Stichting Katholieke Universiteit

Trek, Inc.

Nih N University

Akiyoshi Itoh

Katsuji Nakagawa

Bruce T Williams

Toshio Uehara

Manabu Tani

Theodorus Henricus Maria Rasing

Alexey Kimel

Fredrik Hansteen

Andrei Ivanovitch Kiriliouk

Claudiu Daniel Stanciu

Arata Tsukamoto

Alexey Voldemarovitsj Kimel

Theodorus Henricus Rasing

The invention relates to a magneto-optical switching device for switching magnetization in a medium, comprising a magnetizable medium. According to the invention, a radiation system suited for imparting angular momentum to the magnetic spin system of said magnetizable medium, so as to selectively orient the magnetization of said medium. In addition, the invention relates to a method of switching a magnetizable medium, comprising providing a magnetizable medium; providing a radiation beam of a selectively chosen angular momentum; and targeting said radiation beam to said medium so as to transfer said angular momentum to a magnetic spin system of said magnetizable medium. Accordingly, spin states in magnetic materials can be manipulated using radiation of a suitable angular momentum. An effective magnetic field is generated for orienting the magnetization of the domains and can simultaneously be used to locally heat the material.

Magneto-optical switching device and method for switching a magnetizable medium

A magnetic element having an improved MR rate. The magnetic element is made up of plural layered films of different compositions and exhibits a magneto-resistance effect that the magneto-resistance value is changed on application of a magnetic field. The magnetic element includes a recess for transmitting the current along the layering direction of the layered films. The current flows through the portion of the magnetic element not having the recess so as to have a component along the film layering direction A, with the result that electrons taking part in current conduction may be propagated as the electrons traverse the boundary surfaces of the plural layered films.

Magnetic device, magnetic head and magnetic adjustment method

An electrostatic force microscope wherein electrostatic force applied to the detector is determined through obtaining the field distribution on several different shaped detectors with the calculation of the voltage distribution near the detector with the Finite Element Method to direct the measurement of the absolute charge amount on surface under test so that one can define the differences between the analysis and the results from the parallel plate model. Of interest is how large the error in the charge detection occurs in conjunction with thickness change of dielectric materials to be tested. There is provided a detector with cantilever which has proper shape for the spatial resolution of 10&mgr; made out of nickel foil for an electrostatic force microscope and the electrostatic force which appeared on it has been calculated.

Electrostatic force detector with cantilever for an electrostatic force microscope

An electrostatic force microscope for measuring electrostatic force of a sample under test including a detector comprising a cantilever arm having a tip formation at one end and located so that electrostatic force is induced at the tip due to electrostatic charge on the sample under test, an optical system for transforming bending of the cantilever arm due to electrostatic force induced at the tip into an electrical signal containing a frequency component of the electrostatic force induced at the detector tip, a source for applying bias voltage to the detector, a detector for detecting the frequency component of the electrostatic force induced at the detector tip so that a measurement of electrostatic force on the sample under test can be obtained, and an electrostatic shield operatively associated with the cantilever arm. The shield is located between the cantilever arm and the sample under test, in particular in close spaced relation to the arm. The cantilever arm and the shield are maintained at the same electrical potential so that lines of electrostatic force are terminated at the shield.

Electrostatic force detector with cantilever and shield for an electrostatic force microscope

Growing community of inventors

Chiba, Japan

Akiyoshi Itoh