Denso Corporation

Akitaka Murata

Kiyoshi Yamamoto

Tadashi Suzuki

Hiroyuki Ban

Shoji Miura

Mitsuhiro Saitou

Toshio Sakakibara

Makio Iida

Takayuki Sugisaka

A booster circuit is incorporated in a one-chip microcomputer. In a test mode, a burn-in test is performed by switching power supply systems so that a power supply voltage of 5V is supplied to a 3.3V-type circuit section that normally operates on a power supply voltage of 3.3V in an ordinary state and a boosted voltage of a 5V booster circuit is supplied to a 5V-type circuit section that normally operates on a power supply voltage of 5V in the ordinary state.

Semiconductor device having one-chip microcomputer and over-voltage application testing method

A transmission device includes a transmission line composed of first and second transmission lines. A first circuit block outputs a non-inverted transmission signal to the first transmission line, and a second output circuit outputs an inverted transmission signal to the second transmission line. The second circuit block comprises an impedance element and a comparison circuit for comparing voltages. The same types of impedance elements as the impedance element are interposed in the first and second transmission lines between the first circuit block and the second circuit block.

Transmission device for transmitting a signal through a transmission line between circuits blocks having different power supply systems

A semiconductor device including a semiconductor substrate having a main surface. An insulating film is formed on the main surface of the semiconductor substrate. A semiconductor layer is placed on the insulating film. Side insulating regions extending from a surface of the semiconductor layer to the insulating film divide the semiconductor layer into element regions. The element regions are isolated from each other by the side insulating regions and the insulating film. The semiconductor substrate has a resistivity of 1.5 .OMEGA.cm or lower. A voltage at the semiconductor substrate is set to a given voltage.

Design for a semiconductor device having elements isolated by insulating

Growing community of inventors

Toyohashi, Japan

Akitaka Murata