Kyushu Refractories Co., Ltd.

Femto Deployments Inc.

Kyushu Taika Renga Kabushiki Kaisha

Cyber Laser Inc.

Kyusyu Refractories Co., Ltd.

Nippon Steel Corporation

Sumitomo Metal Industries, Inc.

Mitsui Shipbuilding & Engineering Co., Ltd.

Photo-physics Laboratory Inc.

Akira Watanabe

Tadashi Okuno

Takeji Ueda

Yoshimitsu Takeuchi

Tetsuya Sugimoto

Yasuo Nishikawa

Seiji Kihara

Yasutoshi Mizuta

Yukio Kusaka

Takeo Okamura

Yoshio Hatayama

Gouji Saeki

Yasuhiro Makino

Noboru Shinoda

Hitoshi Sekita

Tetsumi Sumiyoshi

Takeshi Kubota

Nobiru Komatsu

Hirokuni Takahashi

Makoto Mitsudo

Shigeyuki Takanaga

Tetsusaburo Isono

Satomi Kawahara

Kenji Fujiwara

Yuzo Ohtsuki

Hiroyasu Tokuda

Keiji Kamegawa

Goji Saeki

Makoto Mitsudoh

Megumu Shimomi

Hiroshi Tsugita

Takeshi Iba

Yoshihiro Suzuki

Junji Kariya

Kazuyasu Yabuki

Masaaki Koba

Yoh'ichi Wakabayashi

Mikio Ueda

Yoshichika Yanagibashi

Shigeo Sasaki

Bunpei Doi

Takanori Shimizu

Toshiyuki Matsuki

A terahertz-wave signal input unitconfigured to input a terahertz-wave signal from a spectroscopic apparatusfor detecting a terahertz wave acting on a photoresist, and a terahertz-wave signal analysis unitconfigured to analyze a terahertz-wave signal input by the terahertz-wave signal input unitto acquire characteristic information of the photoresist are included, and spectroscopic processing using a terahertz wave is performed on a photoresist to acquire characteristic information of the photoresist (a characteristic value or a correlation characteristic indicating a relationship between a plurality of elements including the characteristic value). Even though the characteristics of the photoresist change depending on the light, since the characteristic change is not caused by the terahertz wave, it is possible to acquire characteristic information of the photoresist without changing the characteristics of the photoresist, and to properly evaluate the characteristics of the photoresist from the characteristic information.

Photoresist characteristics analysis method and characteristics analysis device

The invention is configured to include a spectroscopy cellas a container including one or more spaces, each of which has a plate shape and contains a to-be-measured object that transmits or reflects a terahertz wave; and a holderincluding one or more first holder through-holesanddisposed at positions corresponding to the spaces of the spectroscopy cell, each of the spaces containing the to-be-measured object. A body portionof the spectroscopy cellis made of a resin material that transmits the terahertz wave, and the spectroscopy cellis loaded into the holderand is used. The holderhas a function of holding the spectroscopy cell, and a function of correcting one or more of a distortion, a twist, and a bending of the spectroscopy cell

Measuring jig, and calibration method and terahertz wave measuring method using same

An electromagnetic signal analysis apparatus includes a frequency spectrum obtaining unitto obtain a frequency spectrum that is generated based on an electromagnetic signal obtained by a spectral deviceand represents a property value with respect to a frequency, a water vapor fitting processing unitto fit a waveform of a single fitting function or a composite waveform, of a plurality of fitting functions to a frequency spectrum at a frequency at which absorption of the electromagnetic waves by water vapor is increased, and a property analyzing unitto analyze a property of a liquid sample using at least two values that determine a characteristic of the fitting function used for the fitting, so that the frequency spectrum, at the frequency at which absorption of the electromagnetic waves by water vapor generated from surfaces of the liquid sample is increased is processed to analyze the property of the liquid sample.

Electromagnetic signal analysis apparatus and electromagnetic signal analysis program

A terahertz wave signal analysis device includes a fitting processing unitthat fits synthetic waveforms of a plurality of normal distribution functions which differ in at least one of a center frequency, an amplitude, and a width to a frequency spectrum obtained from a terahertz wave signal and a graph generating unitthat generates a graph using at least one of a center frequency, an amplitude, and a width of a plurality of normal distribution functions used in the fitting as parameters, and it is possible to visualize a feature corresponding to a characteristic of a sample in the form of a graph in an easy-to-understand manner by approximating a frequency spectrum which does not clearly appear because a difference in the characteristic of the sample becomes a feature of a waveform by synthetic waveforms of a plurality of normal distribution functions in a form in which the characteristic of the sample is taken over and generating a graph on the basis of parameters of a plurality of normal distribution functions used in the approximation.

Terahertz wave signal analysis device, terahertz wave signal analysis method, and terahertz wave signal analysis program

A liquid membraneis formed by jetting a liquid sucked from a recovery reservoirand pressurized using a pumpfrom a nozzle of a liquid membrane cartridge. The formed liquid membranemakes contact with a slope wall of the liquid membrane cartridgealong a surface of the liquid membrane. The liquid running down from the slope wall is recovered and stored in the recovery reservoirin order to recover the liquid running down along the slope wall in a decelerated state into the recovery reservoir. As a result, it is possible to prevent air bubbles from being generated by agitation of a liquid of the recovery reservoirwhen the liquid enters the recovery reservoir

Liquid membrane forming device and liquid membrane cartridge used therein

A terahertz wave is spectrally dispersed into two waves which are caused to pass through a sample liquid filmand a reference liquid filmand are then collected, and the terahertz waves in an interference state are detected by a terahertz wave detecting semiconductorConsequently, only spectroscopic information related to a distinctive characteristic of the sample liquid filmis detected. In addition, a predetermined optical path length difference is provided between a path where the terahertz wave is transmitted through the sample liquid filmand a path where the terahertz wave is transmitted through the reference liquid filmby an optical delaying unitIna frequency spectrum obtained by performing Fourier transformation over a terahertz wave signal having an interference waveform by a terahertz wave signal analyzing deviceconsequently, a feature caused by an interaction of dissimilar molecules in the sample liquid filmappears in a spectral intensity at a frequency depending on the optical path length difference.

Terahertz time domain spectroscopic apparatus

There are provided a terahertz wave spectral dispersing unitfor spectrally dispersing a terahertz wave to be generated from a terahertz wave generating semiconductorinto two waves, a terahertz wave focusing unitfor focusing a terahertz wave transmitted through a sample liquid filmand a terahertz wave transmitted through a reference liquid film, and a terahertz wave detecting semiconductorfor detecting the focused terahertz wave, and it is possible to detect the terahertz wave transmitted through the sample liquid filmand the terahertz wave transmitted through the reference liquid filmin an interference state, thereby offsetting a noise made by a stripe-shaped wave generated on the sample liquid filmand a noise made by a stripe-shaped wave generated on the reference liquid film

Terahertz time domain spectroscopy device

A problem diagnosis method and problem repair method for a laser device are provided. The method includes measuring the intensity of scattered light generated by an optical part inside the laser device; referring to data indicating a temporal change in the scattered light predicted under predetermined operating conditions of the laser device, and predicting the seriousness of the problem from the intensity of scattered light; and determining what kind of maintenance work is necessary based on the seriousness of the problem. Additionally, the seriousness of the problem in the optical part can be predicted by executing fuzzy logic based on membership functions defining the relationship between scattered light intensity and the seriousness of problems of optical parts.

Problem diagnosis method and problem repair method for laser device

The energy conversion efficiency from light that is to be converted to converted light of a wavelength conversion device is adjusted so as always to be kept stably at a maximum. The wavelength conversion device is provided with a laser light sourcefor generating a fundamental wave light, a nonlinear optical crystalinto which the fundamental wave light is made to enter to generate converted light, and an optical path adjusting portionfor adjusting the direction of propagation of the fundamental wave light and the position of the light beam of the fundamental wave light in order to make the fundamental wave light enter the nonlinear optical crystalwhile satisfying phase matching conditions. The optical path adjusting portionis constituted so as to be provided with a first reflecting mirrorand a second reflecting mirrorand the first reflecting mirror is provided with adjustment means driven by motors Mand Mand the second reflecting mirror is provided with adjustment means driven by motors Mand MAdditionally, the wavelength conversion device is provided with a semi-transparent mirrorfor splitting off and taking out one portion of output lightand a photodetectorfor detecting this split off output light. An electrical signalthat is output from the photodetectoris input into an adjustment value calculating meansand in this adjustment value calculating means, the necessary adjustment values for the adjustment means in the optical path adjusting portionare calculated using fuzzy inference, and this result is output to an optical path adjusting portion control deviceThe optical path adjusting portion control devicecarries out adjustment of the optical path based upon output signalsfrom the adjustment value calculating means

Wavelength conversion device

Monolithic refractory and gunning material using the refractory

The present invention relates to an injection material for the hot repairing of a blast furnace and an injection method of applying the same. An injection material comprising a refractory material, which was previously adjusted in particle size, a binder, a hardening agent and a hardening-accelerator is fed to a pressure pump having a mixing function and applied to a portion to be repaired of a blast furnace with mixing in said pump. Thus, since the hardening ingredient is not added until the pump portion, the workability of the repair material can be secured in of a blast furnace to be repaired, said injection material being mixed in said pump. Thus, the injection repairing of the blast furnace can be achieved without being influenced by an atmosphere within the furnace.

Injection material for use in blast furnace

Glass ceramics used as dental material, artifical bone, etc. which contain 0.01 to 25 parts by weight of alkali metal oxides (R.sub.2 O), such as Li.sub.2 O, Na.sub.2 O, K.sub.2 O, Rb.sub.2 O, and Cs.sub.2 O, in 100 parts by weight of CaO-Al.sub.2 O.sub.3 -P.sub.2 O.sub.5 system material. During the casting for obtaining the glass ceramics, the molten fluid is sufficiently distributed to the fine corners of a mold, and the temperature for crystallization is low. Also, the time required for the crystallization is short and the crystalline formed shows no internal defects, and has high bending strength.

Glass ceramics

Long potassium titanate fibers (100-3000 .mu.m) made by heat reaction in gas permeable calcination vessel, made of material containing at least 25 wt %, preferably at least 50 wt %, MgO to prevent plugging of the vessel during the reaction and maintain gas permeation.

Method of manufacturing longer fibers of potassium titanate

Calcium phosphate glass-ceramics of high strength and toughness is disclosed. These materials are excellent for artificial dental or bone materials. The strength and toughness of these materials are improved substantially in comparison with conventionally used calcium phosphate glass-ceramics by adding rare earth oxide in them. For dental materials, good aesthetic appearance to natural teeth is also obtained by adding one type, or two or more types of compounds selected from oxides of iron, manganese, cerium, titanium, nickel, zinc, cobalt, tungsten, chromium, and vanadium as color component. Also, if necessary, Al.sub.2 O.sub.3 and/or SiO.sub.2 is contained as coloring assistant agent in that composite. Moreover it is possible to adjust the color tone of each individual's teeth. The rare earth oxide, coloring component, and coloring assistant agent added are incorporated in crystals of calcium phosphate. Consequently, they cause no elution during use.

High strength calcium phosphate glass-ceramic materials

Dental materials using calcium phosphate glass-ceramics and having the color tone with high approximation to that of natural teeth. In those dental materials, calcium phosphate composite, nickel oxide and one or more other type of compounds selected from oxides of iron, manganese, cerium, titanium and tungsten, are contained as coloring component. Also, if necessary, Al.sub.2 O.sub.3 and/or SiO.sub.2 is contained as a color assisting agent in that composite. The calcium phosphate glass-ceramic according to this invention consists of the same components as that of natural teeth. Besides, it is possible to adjust the color tone delicately to match with the color tone of each individual`s teeth. Moreover, the coloring components are incorporated in crystals of calcium phosphate. Consequently, they cause no elution during use and are therefore ideal as dental material.

Good aesthetic artificial dental materials by calcium phosphate

Growing community of inventors

Okayama, Japan

Akira Watanabe