Growing community of inventors

Tokyo, Japan

Akira Tsuji

Average Co-Inventor Count = 1.61

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 19

Akira TsujiJunichi Abe (8 patents)Akira TsujiYoshimasa Ono (6 patents)Akira TsujiShuichi Karino (4 patents)Akira TsujiJiro Abe (4 patents)Akira TsujiHidemi Noguchi (3 patents)Akira TsujiJun Suzuki (2 patents)Akira TsujiYuki Hayashi (2 patents)Akira TsujiMasaki Kan (2 patents)Akira TsujiShigeo Suzuki (2 patents)Akira TsujiTakahiro Iihoshi (2 patents)Akira TsujiTaisuke Tanabe (2 patents)Akira TsujiHiroshi Matsumoto (1 patent)Akira TsujiKenichi Maruhashi (1 patent)Akira TsujiGen Morita (1 patent)Akira TsujiHaruki Takai (1 patent)Akira TsujiTakanori Shigeta (1 patent)Akira TsujiAkira Tsuji (30 patents)Junichi AbeJunichi Abe (73 patents)Yoshimasa OnoYoshimasa Ono (12 patents)Shuichi KarinoShuichi Karino (26 patents)Jiro AbeJiro Abe (7 patents)Hidemi NoguchiHidemi Noguchi (42 patents)Jun SuzukiJun Suzuki (115 patents)Yuki HayashiYuki Hayashi (90 patents)Masaki KanMasaki Kan (37 patents)Shigeo SuzukiShigeo Suzuki (13 patents)Takahiro IihoshiTakahiro Iihoshi (7 patents)Taisuke TanabeTaisuke Tanabe (2 patents)Hiroshi MatsumotoHiroshi Matsumoto (74 patents)Kenichi MaruhashiKenichi Maruhashi (48 patents)Gen MoritaGen Morita (5 patents)Haruki TakaiHaruki Takai (4 patents)Takanori ShigetaTakanori Shigeta (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Nec Corporation (30 from 35,734 patents)


30 patents:

1. 12449542 - Measurement apparatus, information processing apparatus, data specifying method, and non-transitory computer-readable medium

2. 12372351 - Abnormality detection system, abnormality detection method, and computer readable medium

3. 12359908 - Member distinguish apparatus, member distinguish method, and computer-readable medium

4. 12352859 - Position management device, position management system, position management method and non-transitory computer-readable medium having program stored thereon

5. 12345820 - Measurement control apparatus, measurement system, measurement control method, and non-transitory computer readable medium

6. 12339367 - Detection device, determination method, and non-transitory computer-readable medium

7. 12270766 - Inspection support apparatus, inspection support method, and computer-readable medium

8. 12222293 - Detection device, label assignment method, and non-transitory computer-readable medium

9. 12223634 - Inspection apparatus, measuring method, and computer readable medium for acquiring point cloud data of good quality in performing measurement of a member to be inspected using a three-dimensional sensor

10. 12217482 - Processing apparatus, processing method, and computer readable medium

11. 12204030 - Detection apparatus, determination method, and non-transitory computer readable medium storing program

12. 12175593 - Display device, display method, and non-transitory computer-readable medium having program stored therein

13. 12154258 - Surface abnormality detection device and system

14. 12146959 - Monitoring control device, monitoring system, monitoring control method, and non-transitory computer-readable medium with program stored therein

15. 11869179 - Abnormal part display apparatus, abnormal part display system, abnormal part display method, and abnormal part display program

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