Average Co-Inventor Count = 1.61
ph-index = 2
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Nec Corporation (30 from 35,734 patents)
30 patents:
1. 12449542 - Measurement apparatus, information processing apparatus, data specifying method, and non-transitory computer-readable medium
2. 12372351 - Abnormality detection system, abnormality detection method, and computer readable medium
3. 12359908 - Member distinguish apparatus, member distinguish method, and computer-readable medium
4. 12352859 - Position management device, position management system, position management method and non-transitory computer-readable medium having program stored thereon
5. 12345820 - Measurement control apparatus, measurement system, measurement control method, and non-transitory computer readable medium
6. 12339367 - Detection device, determination method, and non-transitory computer-readable medium
7. 12270766 - Inspection support apparatus, inspection support method, and computer-readable medium
8. 12222293 - Detection device, label assignment method, and non-transitory computer-readable medium
9. 12223634 - Inspection apparatus, measuring method, and computer readable medium for acquiring point cloud data of good quality in performing measurement of a member to be inspected using a three-dimensional sensor
10. 12217482 - Processing apparatus, processing method, and computer readable medium
11. 12204030 - Detection apparatus, determination method, and non-transitory computer readable medium storing program
12. 12175593 - Display device, display method, and non-transitory computer-readable medium having program stored therein
13. 12154258 - Surface abnormality detection device and system
14. 12146959 - Monitoring control device, monitoring system, monitoring control method, and non-transitory computer-readable medium with program stored therein
15. 11869179 - Abnormal part display apparatus, abnormal part display system, abnormal part display method, and abnormal part display program