Otsuka Electronics Co., Ltd.

Akira Kawaguchi

Koichi Oka

Kunio Kumagai

Yasuhiro Kubo

Kazunori Tsutsui

Katsuhiro Morisawa

Masayoshi Funato

Tetsuo Hamada

Michio Tsujio

The present invention relates to a light scattering intensity measuring apparatus capable of measuring, as a function of the scattering angle, the intensity of the light scattered from a sample. This apparatus comprises an ellipsoidal mirror for reflecting and condensing the scattered light from a sample ; an image-forming lens disposed at the condensing point of light reflected by the ellipsoidal mirror for forming, on a camera face, the image formed on the surface of the reflection mirror ; and a camera for recording the image formed by the image-forming lens . The scattered light in a wide angle range can be detected in a very short period of time (FIG. ).

Apparatus for measuring characteristics of optical angle

A differential refractometer in which: light from a light source is condensed on a lens; the light thus condensed is guided to a cell which houses a sample of which refractive index is to be measured and a reference of which refractive index is used as a reference value, the sample and the reference being housed as separated from each other in the cell; the light having passed through the cell is guided to an image sensor; and the amount of light deflection due to the difference in refractive index between the sample and the reference is measured, thereby to obtain the refractive index of the sample. The differential refractometer comprises: a light permeable member disposed at such a position that the light permeable member and the image sensor are optically conjugate with respect to the lens, the light permeable member carrying an image having at least two identification portions; and a spatial filter disposed between the light permeable member and the image sensor and adapted to spatially filter light portions which have passed through the two identification portions, the spatial filter causing at least one of the light portions thus spatially filtered to pass through the cell. The refractive index of the sample may be obtained based on the distance between the positions of images, on the detecting surface of the image sensor, of the two identification portions of the light permeable member. Such an arrangement may improve the measuring precision and reduce the number of component elements.

Differential refractometer

There is disclosed a system in which, according to the time domain method, a laser light is irradiated to an object to be measured, photon pulses based on the scattering light from the object to be measured are received, time series data are generated based on the light receiving signal, and based on the time series data thus generated, the particle size distribution of particles in the object to be measured is measured. Thus, the present invention achieves a considerable reduction in time required for finally obtaining the particle size based on the measured data, as compared with a conventional system using a calculator program.

Particle size measuring system

Growing community of inventors

Kyoto, Japan

Akira Kawaguchi