Screen Holdings Co., Ltd.

National Institute of Advanced Industrial Science and Technology

Osaka University

Hokusan Co. Ltd

Fujitsu Corporation

Unitika Ltd.

Fuji Photo Film Company, Limited

Idemitsu Kosan Company, Limited

Kitasato Daiichi Sankyo Vaccine Co., Ltd.

School Juridical Person the Kitasato Institute

3m Innovative Properties Company

Akira Ito

Yoshihiro Kawasaki

Yoshiaki Ohta

Kazuhisa Obuchi

Yoshinori Tanaka

Yoshiharu Tajima

Takashi Dateki

Tsuyoshi Hasegawa

Yoshiaki Echigo

Katsumasa Sugiyama

Toshihiro Shimizu

Masahiko Shimizu

Takahiro Yamaguchi

Hidetoshi Nakanishi

Masayoshi Tonouchi

Iwao Kawayama

Toru Gotanda

Takeshi Matsumura

Noriko Tabayashi

Noriko Itchoda

Emiko Isogai

Nobutoshi Maehara

Ko Sato

Kazue Ueda

Keiichi Asami

Itaru Nakagawa

Yasumitsu Ban

Uiko Kagaya

Kuniaki Yoshioka

Kazuaki Takehara

Teruo Ishihara

Tatsuya Matsumoto

Takeshi Matsui

Yoshiaki Iwaya

Jianming Wu

Eiji Takita

Kousaku Ohinata

Kazutoshi Sawada

Hiroshi Kajimaru

Hidetaka Takato

Hiromi Shibata

Shuhei Nisogi

Katsuhiko Shirasawa

Shigeki Kobayashi

Katsumi Kume

Tatsunori Masaki

Kiyohiko Yamamura

Hanae Sasaki

Yuji Sakai

Hiromi Ikadai

Takashi Aoki

Toshimitsu Mochizuki

Hideyuki Suzuki

Masaru Sato

Saho Asakura

Yuki Higuchi

A light emitting element is positioned at a position right below one principal surface of a substrate rotating about an axis of rotation and away from an end surface of the substrate toward the axis of rotation. The light emitting element is arranged as to be inclined from a horizontal plane so that the light emitting surface faces a peripheral edge part of the substrate. Light emitted from the light emitting surface of the light emitting element is irradiated to a lower surface peripheral edge part of the substrate or a region near the lower surface peripheral edge part. As a result, a processing by the processing liquid is possible in a short time.

Substrate processing apparatus and substrate processing method

It is an object of the present invention to provide a transmission-blocking vaccine using an immunogenic protein which is specifically expressed in the oocyst stage of malaria parasites or a peptide fragment thereof, and an oral transmission-blocking vaccine capable of immunizing various animals involved in the malaria infectious cycle with such a vaccine. The present invention relates to a malaria transmission-blocking vaccine for oral administration containing an immunogenic protein derived from malaria parasite which is specifically expressed in the oocyst stage of malaria parasites or a peptide fragment thereof, and a method of blocking the transmission of malaria using the same.

Malaria transmission blocking vaccine

The object of the present invention is to provide a therapeutic agent illustrating an immediate and sustained effect on chronic intractable external otitis. The present invention provide a composition, pharmaceutical composition, food and feed for preventing and/or treating chronic intractable external otitis, each comprising interferon-&#x3b1; (IFN&#x3b1;) as an active ingredient. Orally administering the composition of the present invention can provide inhibition, alleviation, treatment and prevention for chronic intractable external otitis. According to the present invention, IFN&#x3b1; can give a sufficient effect even when administered in a very small amount.

Therapeutic effect of oral interferon a administration on chronic intractable external otitis

An inspection apparatus inspects a solar cell. The inspection apparatus includes: a short-circuiting element that electrically connects an anode as a p-type semiconductor layer and a cathode as an n-type semiconductor layer of the solar cell to short-circuit the solar cell; an irradiation part that irradiates the solar cell short-circuited by the short-circuiting element with pulse light; and a detection part that detects an electromagnetic wave emitted from the solar cell in response to the irradiation of the solar cell with pulse light from the irradiation part.

Inspection apparatus and inspection method

There is provided a technique for easily inspecting the modification state of a film in a semiconductor substrate. A modification processing device modifies a film by irradiating a semiconductor substrate with pulsed light emitted from a light irradiation part. The modification processing device includes an electromagnetic wave detection part for detecting an electromagnetic wave pulse including a millimeter wave or a terahertz wave radiated from the semiconductor substrate in response to the irradiation with the pulsed light. The modification processing device further includes a modification determination part for determining the modification state, based on the intensity of the electromagnetic wave pulse.

Modification processing device, modification monitoring device and modification processing method

The present invention provides an agent for controllingdiarrhea comprising a Shiga toxin as an active ingredient.

[object Object]

The inspection apparatus includes: a stage that retains the inspection sample; a light irradiator that irradiates the inspection sample with light having a predetermined wavelength to cause the inspection sample to emit a terahertz wave; a detector that detects electric field intensity of the terahertz wave emitted from the inspection sample; and a comparator that compares the electric field intensity of the terahertz wave emitted from the inspection sample to an evaluation reference value. The evaluation reference value is a value (for example, 90% of a saturation value) smaller than an absolute value of the saturation value of the electric field intensity of the terahertz wave, the terahertz wave being generated by irradiating a reference sample, which is a reference of the inspection sample, with the light while different voltages are applied to the reference sample.

A photo device inspection apparatus is an apparatus for inspecting a solar cell panel, which is a photo device. The photo device inspection apparatus includes an irradiation part configured to irradiate the solar cell panel with pulsed light radiated from a femtosecond laser, which is a light source, an electromagnetic wave detection part configured to detect a pulse of an electromagnetic wave radiated from the solar cell panel in response to irradiation with the pulsed light, and a current detection part configured to detect a current generated by the solar cell panel in response to irradiation with the pulsed light.

Photo device inspection apparatus and photo device inspection method

The present invention provides oral compositions which contain interferon &#x3b1; (IFN&#x3b1;) as an active ingredient for preventing and/or treating periodontal disease. The number of causative microorganisms of periodontal disease can be suppressed by administering the compositions into the oral cavity. IFN&#x3b1; of the present invention can produce a sufficient effect even when administered at a very low dose. Furthermore, the compositions of the present invention can also be readily administered to animals such as dogs by formulating them into feed or such.

Oral composition containing interferon-&#x3b1;

An inspecting device includes: an irradiation part for dividing pulsed light emitted from a femtosecond laser into measurement pump light and measurement probe light, to irradiate a solar cell; a detection part for detecting an electromagnetic wave emitted from the solar cell in accordance with the irradiation with the measurement probe light; and a measurement delay part for delaying the time of arrival of the measurement probe light at the solar cell relatively to the measurement pump light. The irradiation part is provided with a galvano mirror for scanning with the measurement probe light a wide range which is wider than an irradiated range (pump light spot) being irradiated with the measurement pump light in a solar cell.

Inspecting device and inspecting method

An inspection apparatus includes an irradiation part that emits plural pieces of pulse light having different wavelengths to irradiate a multi-junction type solar cell; a wavelength setting part that sets the wavelengths of the plural pieces of pulse light with which the multi-junction type solar cell is irradiated by the irradiation part; and a detection part that detects an electric field intensity of an electromagnetic wave emitted from the multi-junction type solar cell in response to the plural pieces of pulse light with which the multi-junction type solar cell is irradiated by the irradiation part. The irradiation part includes a delay element that delays a time the multi-junction type solar cell is irradiated with the pulse light by a time &#x394;trelative to the pulse light.

An inspection apparatus according to an aspect of the present invention inspects a solar cell that is of a photo device. The inspection apparatus includes: an irradiation part that irradiates the solar cell with pulse light emitted from a femtosecond laser that is of a light source; an electromagnetic wave detection part that detects an electromagnetic wave pulse emitted from the solar cell in response to the irradiation of the solar cell with the pulse light; and a PL light detection part that detects photoluminescence light generated in the solar cell in response to the irradiation of the solar cell with the pulse light.

An inspection apparatus is an apparatus for inspecting a solar cell panel. The inspection apparatus includes: an excitation light irradiation part for irradiating the solar cell panel with pulsed light for causing the solar cell panel to radiate an electromagnetic wave pulse; a detection part for detecting the electromagnetic wave pulse radiated from the solar cell panel in response to irradiation with the pulsed light; and a temperature changing part for changing a temperature of the solar cell panel at a part irradiated with the pulsed light.

An inspecting device serves to inspect a solar cell. The inspecting device includes an irradiation part for irradiating with pulsed light and a detection part having a detector for detecting an electromagnetic wave pulse radiated from the solar cell depending on the irradiation with the pulsed light. The detector detects an electric field intensity of the electromagnetic wave pulse depending on irradiation with probe light emitted from a light source (a femtosecond laser) of the pulsed light. Moreover, the inspecting device includes a delay part for delaying a timing for detecting the electromagnetic wave pulse in the detector. Furthermore, the inspecting device includes an electromagnetic wave pulse analysis part for detecting a negative peak of the electric field intensity in a temporal waveform of the electromagnetic wave pulse.

An inspecting device inspects an inspecting target that is a semiconductor device or a photo device. The inspecting device includes: a stage for holding an inspecting target; a femtosecond laser for emitting pulsed light; a galvano mirror for obliquely irradiating the inspecting target with the pulsed light, while changing an optical path of the pulsed light, to scan the inspecting target with the pulsed light; and a detection part for detecting an electromagnetic wave emitted non-coaxially with the pulsed light from the inspecting target in accordance with the illumination with the pulsed light.

Growing community of inventors

Kyoto, Japan

Akira Ito