Rigaku Industrial Corporation

Akira Arake

Yasujiro Yamada

Hiroaki Kita

Naoki Kawahara

Takashi Shoji

Kouichi Aoyagi

Minoru Inoue

Yoshihisa Yamamoto

Takashi Misonoo

Takashi Sakamoto

An analyzing apparatus , such as a fluorescence X-ray analyzer, being able to analyze samples automatically, by transferring the samples into an analysis chamber, sequentially, comprising: an interruption recover device for automatically turning on an electric power supply for the analyzing apparatus, when electricity is re-established after interruption thereof; and a data processing computer , being connected through the uninterruptible power source to an electric power source, wherein, the data processing computer includes function for temporality memorizing analysis information of the automatic analyzing apparatus when the interruption of electricity occurs, and function for supplying electricity to the analyzing apparatus through the interruption recover device and also for re-starting the analysis of the samples upon the basis of the memorized analysis information at the time when the interruption occurs, when the electricity is recovered, thereby being suitable for unmanned operation thereof.

Analyzing apparatus

A fluorescent X-ray analyzing apparatus capable of being used as either a wavelength dispersive type or an energy dispersive type is provided, with which the analysis can be performed quickly and accurately. The fluorescent X-ray analyzing apparatus includes a detecting unit for detecting and analyzing fluorescent X-ray (,) emitted from at least one target area (,) of a sample (,) to be analyzed as a result of excitation of such target area (,) with a primary X-ray (,). The detecting unit includes a wavelength dispersive type detecting unit (,) including a spectroscope (,) and a first detector (,), and an energy dispersive type detecting unit (,) including a second detector (,) of an energy dispersive type. The angle &thgr;1 formed between a first path (,) of travel of the fluorescent X-ray from the target area (,) towards the spectroscope (,) and a surface of the sample (,) is equal to the angle &thgr;2 formed between a second path (,) of travel of the fluorescent X-ray from the target area (,) towards the second detector (,) of the energy dispersive type and a surface of the sample (,), but the second path (,) is shorter than the first path (,).

Fluorescent X-ray analyzer useable as wavelength dispersive type and energy dispersive type

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Ibaraki, Japan

Akira Arake