Kyoto University

Akio Kaneta

Yoichi Kawakami

Mitsuru Funato

Katsuhito Nishimura

Tsuneaki Hashimoto

A scanning probe microscope includes: a first and second probes for scanning a sample while maintaining the distance to the sample surface; crystal oscillators holding each of the first and second probes; and a modulation oscillator for providing the first probe with a vibration of a specific frequency which is different from the resonant frequency of each crystal oscillator. A control unit monitors the vibration of the specific frequency of the first and second probes, detects proximity of the first probe and the second probe to each other based on the change of the specific frequencies, and controls the drive of the first and second probes.

Growing community of inventors

Yasu, Japan

Akio Kaneta