Mitsubishi Electric Corporation

Akio Kamimurai

Katsuyuki Sumimoto

Hideki Shimauchi

Keisuke Katsurada

Yoshinori Tatenuma

Masahiro Nakajima

Takeshi Musha

Junya Sasaki

Takayuki Nakai

Akira Koshimizu

Masashi Mori

Kanji Kitamura

Mutsuo Daito

Masatoshi Uchino

Takeharu Umegami

An environmental power generation device outputs power generation charges to a power supply line to which a capacitor is connected. When a power generation voltage corresponding to a charging voltage for the capacitor is equal to or higher than an power-on criterion voltage, a voltage comparison circuit outputs a voltage detection signal. An internal circuit of a semiconductor device is powered on in response to the voltage detection signal. A setting change circuit switches the power-on criterion voltage in accordance with a setting input.

Semiconductor device and multi-turn encoder

An information processing device acquires related information related to support information for supporting safe driving of a vehicle transmitted from the vehicle to one or more apparatuses among a roadside unit, another vehicle, and a mobile terminal device, and calculates a score of an owner of the vehicle based on the related information.

Information processing device

When a state where a power-generation voltage of a vehicle AC power generator is the same as or lower than a predetermined voltage has continued for a predetermined time or longer, a power generation controller stops or disables a low-voltage protection circuit from performing its operation so that an unintentional voltage rise caused by the low-voltage protection circuit is prevented.

Power generation controller for vehicle AC power generator

A semiconductor integrated circuit includes: a main circuit; a non-volatile memory; and a self-diagnosis circuit configured to execute, when the semiconductor integrated circuit is to be powered off, self-diagnosis processing in which the main circuit is diagnosed and a diagnosis execution record indicating whether the diagnosis is completed and a diagnosis result indicating a result of the diagnosis are stored in the non-volatile memory. The self-diagnosis circuit is configured to: determine, when the semiconductor integrated circuit is powered on, whether there is a failure in the main circuit by reading the diagnosis execution record and the diagnosis result out of the non-volatile memory; and shift a state of the main circuit to a safe state when determining that there is a failure in the main circuit, and instruct the main circuit to start normal operation when determining that there is no failure in the main circuit.

Semiconductor integrated circuit and rotation detection device

A P terminal that is connected to an armature coil, an LIN terminal for LIN communications, and an interface circuit are provided, and the interface circuit converts serial signals which are input from the P terminal and the LIN terminal into parallel signals and transmits scan test signals input from the P terminal and the LIN terminal to a digital circuit and transmits a scan test signal output from the digital circuit to the LIN terminal.

Electric power generation control device of alternating current generator for vehicles

An object of this invention is to obtain a phase voltage detection circuit that can detect a phase voltage signal reliably even when a leak current flows therein and a DC bias voltage of the phase voltage signal varies. A phase voltage detection circuit that detects a phase voltage signal generated by an armature coil of an AC power generator includes a peak hold circuit that determines an envelope of the phase voltage signal using an operational amplifier, a voltage offsetting circuit that shifts an output voltage from the peak hold circuit by a preset offset amount, and a comparator that compares the phase voltage signal with an output voltage from the voltage offsetting circuit, and outputs a phase voltage detection signal.

Phase voltage detection circuit and power generation control device

Provided is a comparator configured to compare input voltages, which are input to a first dynamic comparator and a second dynamic comparator, with a reference voltage, select either an output signal of the first dynamic comparator or an output signal of the second dynamic comparator based on the comparison result, output the selected output signal, and control clock signals, which are input to the first dynamic comparator and the second dynamic comparator respectively, based on the comparison result, so as to stop the operation of the dynamic comparator of which output signal is not selected.

Comparator, AD converter, semiconductor integrated circuit, and rotation detector

Provided is an AD converter having a rail-to-rail input voltage range and being free of a missing code and monotonicity loss. A comparator includes a first comparator having an NMOS differential input stage, a second comparator having a PMOS differential input stage, and an output selection circuit configured to select any one of outputs of the two comparators. A correction circuit acquires in advance a first AD converted value in the case of using the first comparator and a second AD converted value in the case of using the second comparator with respect to the same input voltage to calculate a correction value, and performs correction processing based on the correction value to suppress an offset error between the first AD converted value and the second AD converted value.

Ad converter, semiconductor integrated circuit, and rotation detector

A first flip-flop outputs a first output signal as a first switch signal that controls a first switch. A second flip-flop outputs a second output signal based on a clock signal and the first output signal. A first inverting circuit generates a first inverted signal obtained by inverting the first output signal. A second AND circuit outputs a signal that is an AND of the first inverted signal and the second output signal, as a second switch signal that controls a second switch.

Switch control circuit, semiconductor apparatus, and magnetic ink reading apparatus

A one-time memory control apparatus is obtained that prevents erroneous opening of a fuse from causing logic conversion and enhances the reliability. The one-time memory control apparatus includes an opening current creation fuse C opening switch and an opening current creation fuse D opening switch that each allow a fuse opening current from a fuse opening current creation circuit to flow in response to an opening enable signal, and a fuse opening permission signal creation circuit that receives respective logic signals corresponding to the states of fuse opening currents that flow through an opening current creation fuse C and an opening current creation fuse D, and that creates a fuse opening permission signal.

Growing community of inventors

Tokyo, Japan

Akio Kamimurai