Japan Science and Technology Agency

Akinori Saeki

Shuhei Seki

An evaluation systemaccording to the present invention includes: a light sourcefor exposing a pulsed white light or a pulsed laser light onto a sample; a microwave exposing and detecting unitfor exposing a microwave onto an organic materialand for detecting the intensity of the microwave which has passed through the organic material; a microwave passing unitfor making the microwave pass through the organic materiala plurality of times; and an evaluating unitfor evaluating the photoelectric conversion characteristics of the sample based on the intensity of the microwave which has passed through the organic materialwhen the pulsed white light or the pulsed laser light is exposed and the intensity of the microwave which has passed through the organic materialwhen the pulsed white light or the pulsed laser light is not exposed.

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Suita, Japan

Akinori Saeki