Tdk Corporation

Canon Kabushiki Kaisha

Akinori Ohi

Yukio Takahashi

Takashi Suzuki

Kouichi Kakuda

Ryuichi Wada

Yukari Akita

Hiroki Choto

Takahiro Sato

Takuya Aoki

Masahiro Endo

Tetsuhiro Takahashi

Takeshi Shibayama

Hidenobu Umeda

Ko Ito

Tomohisa Fukuoka

Asuka Murai

Tatsuya Shimazaki

Bungo Sakurai

To improve a mounting reliability while maintaining a thickness of the external electrode at a side face of a multilayer electronic component thin. The multilayer electronic component includes ceramic body in which ceramic layers and an external electrode formed to an end face of the ceramic body. The upper electrode layer includes an element having higher standard electrode potential than Cu. The external electrode includes an external electrode end part and an external electrode extension part which is integrally formed with the external electrode end part. 1.20&#x2264;t2/t1&#x2264;4.50 is satisfied in which t1 is a total thickness of a thickness of the intermediate electrode layer thickness and t2 is a length from an end of the base electrode layer to an end of the upper electrode layer along the first axis of the external electrode extension part connected by the conductive adhesive.

Multilayer electronic component and mounting structure thereof

A measurement apparatus that is capable of positively generating a projection pattern suitable for a to-be-read object. A camera scanner as the measurement apparatus projects a projection pattern formed by a plurality of projection lines on a to-be-read object to thereby measure the bending of the to-be-read object. A distance to the to-be-read object is measured, and distance distribution information of the to-be-read object for identifying a shape, a size, and a position of the to-be-read object is generated based on the measured distance. The projection pattern is generated based on the generated distance distribution information of the to-be-read object.

Measurement apparatus that scans original, method of controlling the same, and storage medium

A ferrite composition composed of a main component including 26 to 46 mol % of an iron oxide in terms of FeO, 4 to 14 mol % of a copper oxide in terms of CuO, 0 to 26 mol % of a zinc oxide in terms of ZnO, and a residue of 40.0 mol % or more of a nickel oxide in terms of NiO. The ferrite composition, with respect to 100 parts by weight of the main component, is also composed of a subcomponent including 0.8 to 10.0 parts by weight of a silicon compound in terms of SiO, 1.0 to 15.0 parts by weight of a cobalt compound in terms of CoO, and 0.7 to 30.0 parts by weight of a bismuth compound in terms of BiO. A value of the cobalt compound content in terms of CoOdivided by the silicon compound content in terms of SiOis 0.4 to 5.5.

Ferrite composition and electronic component

A ferrite composition comprises a main component and a sub component. The main component is comprised of 25.0 to 49.8 mol % iron oxide in terms of FeO, 5.0 to 14.0 mol % copper oxide in terms of CuO, 0 to 40.0 mol % zinc oxide in terms of ZnO, and a remaining part of nickel oxide. The sub component includes 0.2 to 5.0 wt % silicon oxide in terms of SiO, 0.10 to 3.00 wt % bismuth oxide in terms of BiO, and 0.10 to 3.00 wt % cobalt oxide in terms of CoO, with respect to the main component.

To specify a contour to be detected even when there are a plurality of candidates of the contour on the periphery of a photographing target, an image processing apparatus comprises: a determining unit which detects a plurality of candidate points being the candidates of the contour of a subject based on distance image information of the subject in an image, and determines an inspection-target area in the image based on the detected candidate points; and a specifying unit which detects line segments existing in the inspection-target area determined by the determining unit, based on luminance information of the inspection-target area, and specifies the line segment being the contour of the subject based on the candidate point from the detected line segments.

Image processing apparatus, image processing method and program

There can be provided an NiCuZn-based ferrite material containing an iron oxide, a copper oxide, zinc oxide and a nickel oxide in predetermined amounts as main components and a bismuth oxide, a silicon oxide, magnesium oxide and a cobalt oxide in predetermined amounts as additional components. Due to the predetermined amounts of the additional components, the ferrite material has an extremely good temperature characteristic (a change in permeability along with a change in temperature is small), a high quality coefficient Q and high strength.

Ferrite material

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Tokyo, Japan

Akinori Ohi