Sumitomo Electric Industries, Limited

Mitsubishi Chemical Corporation

Akinori Kimura

Hiroshi Suganuma

Asako Motomura

Yoko Sugiyama

Toshiyuki Tanaka

Takumi Watanabe

Ichiro Sogawa

Nobuhiko Ueno

Maki Saito

Masato Andou

Tatsushi Isojima

Takuya Okuno

Tetsuo Kasai

Phuong Thi Kim Dao

A fine particle measurement device includes a support stand () that has a groove (F) extending in a predetermined direction and is configured to support in the groove an observation container (), which has an elongate shape and accommodates a liquid sample containing a fine particle therein such that an extending direction of the groove (F) coincides with a longitudinal direction of the observation container (); and an imaging unit () that is configured to capture an image of the fine particle in the observation container () at a position where the support stand is out of a field of view, the observation container () being supported by the support stand ().

Fine particle measurement device

An observation container () includes: a bottom portion that includes a bottom wall (A) (first plate part) and a bottom wall (B) (second plate part) which intersect each other and that is configured to accommodate a liquid sample O as a sample containing microparticles to be imaged by imaging units (A) and (B) serving as an imaging device; and a region that has transparency with respect to a wavelength of light used for observation of the microparticles.

Observation container and microparticle measurement device

Sample holder

There are provided a microparticle measuring device capable of analyzing microparticles with increased accuracy and a microparticle analysis method. According to a microparticle measuring device, transmission images of microparticles in the liquid sample are captured by a plurality of image capturing units that are disposed in mutually different orientations with respect to a liquid feed pipe when viewed in a cross section orthogonal to the flowing direction of a liquid sample in the liquid feed pipe, and the microparticles are analyzed by an analyzing unit on the basis of the transmission images.

Microparticle measuring device and microparticle analysis method

The present invention is directed to provide at least one of a novel thermosetting resin composition using an epoxy compound, a method for producing the composition, a method for producing a novel cured resin using an epoxy compound, and a novel method for causing self-polymerization of an epoxy compound. The thermosetting resin composition includes an epoxy compound, a gallium compound, and a silanol source compound. The method for producing the thermosetting resin composition includes a step of mixing the epoxy compound with the gallium compound and the silanol source compound. The method for producing a cured resin includes a step of heating an epoxy compound in the presence of a gallium compound and silanol. The method for causing self-polymerization of an epoxy compound is characterized by using a gallium compound and silanol as catalysts.

Thermosetting resin composition, method for producing same, method for producing cured resin product, and method for causing self-polymerization of epoxy compound

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Yokohama, Japan

Akinori Kimura