Hitachi-high-technologies Corporation

Akinari Hanawa

Yoshifumi Taniguchi

Toshie Yaguchi

Hirokazu Tamaki

Hideki Kikuchi

Takashi Dobashi

Keitaro Watanabe

A charged particle beam device wherein a transmission image corresponding to an arbitrary diffraction spot or a diffraction pattern corresponding to a partial range in the transmission image are easily and automatically captured. A charged particle beam device having: an image-capturing unit for forming an image of a sample; a diaphragm disposed in the image-capturing unit, a plurality of openings having different sizes for transmitting an electron beam from the sample being formed in the diaphragm; a movement unit for varying the position of the diaphragm; and a display unit for displaying the formed image, wherein when the operator selects, e.g., a diffraction spot (A) on the display unit, the movement unit moves the diaphragm from the positional relationship between the diaphragm and the image in accordance with the position of the diffraction spot (A).

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Tokyo, Japan

Akinari Hanawa