Horiba, Ltd.

Akimichi Kira

Yoshimichi Sato

Yoshinori Hosokawa

Kozo Ishida

Kozo Kashihara

Seiichi Taniguchi

Haruto Sugishita

An X-ray shielding mechanism to block off-axis X-rays for example, in an X-ray analytical instrument such as a fluorescent X-ray spectroscope is provided. X-rays are guided on-axis by elongated glass guide tubes and outer elongated metallic protective pipes are spatially positioned on the exterior of the glass guide tubes to block off-axis X-rays.

X-ray shielding mechanism for off-axis X-rays

A method and apparatus for measuring fluorescent X-rays from a sample include an X-ray voltage tube having a variable applied voltage during the measurement cycle. The resulting fluorescent X-rays are measured by a detector that output representative signals. The representative signals are used to calculate a characteristic energy spectrum which can be displayed to an operator. The use of a varying voltage ensures detecting both light and heavy elements. An X-ray filter can also be inserted to prevent any characteristic X-rays from being generated from the X-ray gun itself.

Apparatus and method for fluorescent x-ray analysis of light and heavy

The present invention provides a fluorescent X-ray qualitative analytical method of determining elements in a sample by preliminarily measuring a standard peak position corresponding to an energy position of fluorescent rays generated from each element expected in a sample. The standard peak positions are then stored. The sample is then radiated with X-rays to cause fluorescent X-rays to be generated from the elements in the sample. Spectral data is obtained from the fluorescent X-rays to determine the peak-generating positions from the spectral data and then a comparison is made with the stored standard peak positions to determine the elements contained in the sample.

Fluorescent X-ray qualitative analytical method

A fluorescent X-ray quantitative analysis apparatus generates a stream of primary X-rays that are subject to variable conditions such as voltage, X-ray filters, and gas conduit conditions. A sample is supported to receive the beam of primary X-rays, and then measurements are made of the secondary X-rays resulting from impact with the sample. Conditions are changed to affect the primary X-rays, and a second measurement is made of the secondary X-rays from the sample. A computer circuit can determine the concentration of elements in the sample from their respective measurements, for example, by resolving a plurality of simultaneous equations.

Fluorescent X-ray quantitative analysis apparatus

An apparatus for detecting heavy metals in an oil sample which radiates X-rays from a target type X-ray tube through an iron filter and then upon a sample cell containing the oil to be measured therein and detects fluorescent X-rays excited in the oil by an energy dispersion type fluorescent X-ray detector.

Apparatus for detecting nickel/vanadium contained in oil

An apparatus for analyzing carbon in metals, in which a metallic sample is burned in a current of oxygen in a combustion furnace and the concentration of carbon contained in the metallic sample is calculated from the total concentration of carbon monoxide and carbon dioxide in the gas generated in the combustion furnace, the concentration determined by means of a non-dispersive infrared analyzer. The non-dispersive infrared analyzer is provided with a detector which exhibits almost the same sensitivity to both carbon monoxide and carbon dioxide.

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Miyanohigashi, Japan

Akimichi Kira