Hitachi, Ltd.

Akiko Shiratori

Tatsuo Nakagawa

Chihiro Uematsu

Junko Tanaka

Yuzuru Shimazaki

The present disclosure provides a technique capable of manufacturing a measurement cell having a high specimen utilization ratio in the case of using a measurement cell that introduces a specimen into a surface hole. In the measurement cell manufacturing method according to the present disclosure, a measurement cell includes a channel wall protruding from the lower surface substrate toward the through-hole, and a specimen solution is introduced into a lower surface side space to introduce the specimen into the through-hole.

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Tokyo, Japan

Akiko Shiratori