Arkray, Inc.

Akiko Okami

Yoshiharu Sato

Hirokazu Matsuda

Kazuo Fukuda

Provided are a measuring apparatus and method for obtaining a measurement value from a response to a signal applied to a sample, wherein the measuring apparatus includes a first measuring unit that measures a first electric response to a first signal that is input to a first pair of electrodes that can come into contact with a sample, a second measuring unit that measures a second electric response to a second signal that is input to a second pair of electrodes that can come into contact with the sample, the second signal changing its value from a first level to a second level and thereafter maintaining the second level for a certain period of time, as a peak value of a response signal with respect to the change in the second signal, and a control unit that corrects a value indicating the amount of a measuring target component of the sample, the value being obtained from the first electric response, based on the peak value of the response signal.

Growing community of inventors

Kyoto, Japan

Akiko Okami