Kabushiki Kaisha Toshiba

Toshiba Electron Tubes & Devices Co., Ltd.

The University of Tokyo

Toshiba Energy Systems & Solutions Corporation

Akiko Kakutani

Takeshi Yoshiyuki

Kiyokazu Sato

Tsutomu Kurusu

Akihiro Osanai

Kazuo Hayashi

Kiyoshi Hashimoto

Nobutada Aoki

Motosuke Miyoshi

Takashi Yazawa

Takayuki Sako

Yoshiharu Kanai

Takeshi Takeuchi

Tsuyoshi Sugawara

A technique for outputting heterologous ions having the same per-nucleon energy at different timings by using one ion source is provided. An ion generation device includes: an ion generation energy setter that causes first ions and second ions generated by ionization in a vacuum chamber to be emitted in a mixed state from an opening; an electric-field voltage adjuster that imparts a same predetermined per-nucleon energy to each of the first and second ions by applying electric potential formed between the opening and extraction electrodes while switching the electric potential between first and second electric-field voltages; and an excitation current adjuster that causes the first and second ions to be outputted at different timings by supplying a coil of a separation electromagnet with an excitation current while switching the excitation current between first and second excitation currents.

Ion generation device, ion generation method, and ion generation program

According to one embodiment, there is provided an ion source. The ion source includes a vacuum-exhausted vacuum chamber, a target which is set in the vacuum chamber and generates a plurality of valences of ions by irradiation of a laser beam, an acceleration electrode which is applied with voltage in order to accelerate the ions generated by the target, and an intermediate electrode which is provided between the target and the acceleration electrode and is applied with reverse voltage of the voltage applied to the acceleration electrode.

Ion source

One embodiment of a particle accelerator includes: a particle source from which a particle beam is extracted with a beam pulse width of not greater than 2 &#x3bc;sec; a linear accelerator for accelerating the particle beam extracted from the particle source; a synchrotron for receiving the particle beam transported thereto from the linear accelerator and causing the particle beam to circulate in order to accelerate it until it gets to a predetermined energy level; a bump electromagnet for shifting the circulating path of the particle beam each time it makes a full turn; and a control unit for controlling the extent of magnetic excitation of the bump electromagnet and for controlling the timing of magnetic excitation of the bump electromagnet according to the pulse timing of the particle source.

Particle accelerator and medical equipment

According to one embodiments, an ion source connected with a vacuum-exhausted downstream apparatus is provided. The ion source includes a vacuum chamber which is vacuum-exhausted, a target which is set in the vacuum chamber and generates ions by irradiation of a laser beam, a transportation unit which transports the ions generated by the target to the downstream apparatus, and a vacuum sealing unit which seals the transportation unit so as to separate vacuum-conditions of the vacuum chamber side and the downstream apparatus side before exchanging the target set in the vacuum chamber.

According to one embodiment, there is provided a laser ion source. The laser ion source includes a vacuum chamber which is vacuum-exhausted and in which a target is transported and set, a valve which is opened when the target is transported into the vacuum chamber and is closed except for the transportation, a target supply chamber which holds the target to be movable, and a transportation unit which transports to the vacuum chamber the target held on the target supply chamber while opening the valve after the target supply chamber is vacuum-exhausted while closing the valve.

Laser ion source

Provide an ion source for outputting ion beam with high purity of polyvalent positive ion. The ion sourceincludes: a targetfrom which electron and positive ion are generated by plasma formed by laserirradiation; a first power supply source (first voltage E) that sets an electric potential of the targethigher than that of a destination of the positive ion (corresponding to an acceleration channelin FIG.); and a second power supply source (second voltage E) that sets an electric potential of on a pass (corresponding to a filter electrodein FIG.) from the targetto the destinationhigher than that of the target

Ion source including a filter electrode

A laser-ablation plasma generator generates laser-ablation plasma from a target in a vacuum vessel. An ion beam extractor generates an ion beam by extracting ions included in the laser-ablation plasma from the vacuum vessel. An ion detector detects unintended ions other than intended ions, which are obtained by ionizing the elements in the target, out of ions in the vacuum vessel and outputs a detection signal representing a value which is a number of the unintended ions or a mixing ratio of the unintended ions to the intended ions as a detection result. The ion source using the laser beam makes it possible to normally monitor unintended ions other than intended ions out of ions in the vacuum vessel.

Ion source, heavy particle beam irradiation apparatus, ion source driving method, and heavy particle beam irradiation method

One embodiment of a particle accelerator includes: a vacuum container with its inside evacuated to produce vacuum, the vacuum container being formed with a laser beam entrance window for allowing a laser beam to enter; a target arranged in the vacuum container so as to be irradiated with a laser beam to generate ions; and a condenser lens for focusing the laser beam onto the target. The condenser lens is arranged at the laser beam entrance window of the vacuum container, and takes a role of a vacuum bulkhead.

Laser ion source and heavy particle beam therapy equipment

According to one embodiment, a laser ion source is configured to generate ions by application of a laser beam, the laser ion source including a case to be evacuated, an irradiation box disposed in the case and including a target which generates ions by irradiation of laser light, an ion beam extraction mechanism which electrostatically extracts ions from the irradiation box and guides the ions outside the case as an ion beam, a valve provided to an ion beam outlet of the case, the valve being opened at ion beam emission and being closed at other times, and a shutter provided between the valve and the irradiation box, the shutter being intermittently opened at ion beam emission and being closed at other times.

The present invention relates to an X-ray source for emitting a characteristic X-ray and a fluorescent X-ray analyzing apparatus using the X-ray source. A secondary target is arranged in superposition on a primary target. An electron beam generated by an electron gun enters the primary target, which passes and emits a continuous X-ray. The secondary target transmits and emits a characteristic X-ray excited by the continuous X-ray emitted from the primary target. The primary target and the secondary target are superposed one on the other, so that the continuous X-ray emitted from the primary target efficiently excites the secondary target thereby to efficiently generate the characteristic X-ray.

X-ray source and fluorescent X-ray analyzing apparatus

A transmission target of a vacuum container is operable to have a ground potential and an electro-optical system is floated at a positive potential in the vacuum container. An electron beam, which is converged by means of the electro-optical system, is decelerated immediately before the electron beam is incident to the transmission target. The electron beam has energy that is several times of the final set value until the electron beam passes through the electro-optical system, and a divergence action exerted by a spatial electric charge effect is reduced. Color aberration of the electro-optical system is proportional to energy of the electron beam. Thus, if the electron beam is decelerated after the electron beam has passed through the electro-optical system, aberration is reduced in proportion to the degree of deceleration, making it possible to concurrently reduce a focus size.

Growing community of inventors

Yokohama, Japan

Akiko Kakutani