Kabushiki Kaisha Nihon Micronics

Akihisa Akahira

Kiyotoshi Miura

Hidehiro Kiyofuji

Yuji Miyagi

Yoshinori Kikuchi

Katsuji Hoshi

Tatsuo Inoue

Takayuki Hayashizaki

Hisao Narita

Tomoaki Kuga

Hitoshi Sato

Masatomo Uebayashi

Mizuho Kon

Tatsuo Ishigaki

Kenichi Suto

An electrical connecting device includes probes, and a probe head including a middle guide plate arranged between a top guide plate and a bottom guide plate and closer to the bottom guide plate so as to lead the probes to penetrate therethrough. The top guide plate and the middle guide plate are provided with guide holes through which the probes are inserted at positions shifted between the top guide plate and the middle guide plate so as to lead the probes to be held in a bent state between the top guide plate and the middle guide plate. The probes have a structure easier to bend at a region excluding a maximum stress part than at the maximum stress part defined at a position at which a maximum stress is applied to the probes buckled when tip end parts of the probes are brought into contact with an inspection object.

Electrical connecting device

Provided is an electric connecting apparatusincluding a plurality of probes, a probe substrateconnected to base end portionsof the probes, and a probe support body, when tip end portionsof the probesare pressed by a device under test, preventing the adjacent probesfrom interfering. The probe support bodyincludes a plate-like guide portionincluding guide holes through which the probespass. The guide portionincludes an upper guide portion, a lower guide portion, and a middle guide portion. The probes pass through the guide holes of the upper guide portion, the middle guide portion, and the lower guide portionto be guided toward the device under test. The middle guide portionis provided to be movable in a perpendicular direction X perpendicular to a thickness direction Y.

Electric connecting apparatus

An automatic switching mechanism is controlled by a probe card independent from a tester without limitation of the number of control signals from the tester. A probe card and an inspection apparatus include probes to be brought into contact with electrodes of inspection targets and a power supply channel electrically connecting the probes to a tester. The automatic switching mechanism divides each of the power supply channels into a plurality of power supply wiring portions, which are respectively connected to the probes; and shuts off the power supply wiring responsive to electrical fluctuation such as overcurrent. An electrical fluctuation detection mechanism detects an electrical fluctuation due to a defective product among the inspection targets. A control mechanism, responsive to detection of an electrical fluctuation, shuts off the power supply wiring portion if the electrical fluctuation is caused by the automatic switching mechanism.

Probe card and inspection apparatus

An embodiment of an electrical connecting apparatus comprises a probe base plate and a plurality of contacts provided with tips to be pressed against electrodes of a device under test and arranged on the underside of the probe base plate. The distance dimensions from an imaginary plane parallel to the probe base plate to the tips of the contacts are made the greater toward the center of the probe base plate.

Electrical connecting apparatus

An electrical connecting apparatus for use in electrical measurement of a device under test comprises a supporting member and a flat plate-like probe base plate. On one surface of the probe base plate are provided multiple probes abutting on electrical connecting terminals of the device under test undergoing an electrical test. Also, on the other surface of the probe base plate is formed a securing portion provided with a screw hole opened at the top portion. It further has a generally cylindrical spacer and a screw member passing through the spacer and whose tip end is screwed in the screw hole of the securing portion. As for the spacer, movement in the axial direction is restricted in relation to the supporting member by a restricting means. The spacer has a head portion whose underside is mounted on the other surface of the supporting member and a body portion communicating with the head portion at one end, arranged to pass through a through hole formed in the supporting member, and whose other end is arranged to abut on the top face of the securing portion.

The object of the present invention is to prevent an operator from touching electronic elements arranged on an upper surface of a probe assembly of an electrical connecting apparatus at the time of carrying the electrical connecting apparatus and to restrict bowing of the probe assembly caused by the temperature difference between the upper surface and the lower surface of the probe assembly. An electrical connecting apparatuscomprises a probe assembly having a plurality of contactorson a lower surface and a plurality of electronic elementsarranged on an upper surface, a coverarranged on the upper surface of the probe assembly so as to close a spacein which the electronic elements are arranged, and two grippersattached to the cover. Each gripperhas one endand the other end, has a region ranging from one end to the other end formed approximately in a U-shape, and is attached to a main body portionof the cover at both the ends.

A wiring path of a circuit board has a first vertical path portion penetrating the circuit board at its outer edge in its thickness direction and connected to a connector on one surface, a second vertical path portion penetrating the circuit board in its thickness direction and connected to the electric coupler on the other surface, and a lateral path portion connecting both vertical portions, and the second vertical path portion is formed within an arrangement area (S) of a reinforcing plate. One connecting end portion (electric coupler side) of the wiring path of the circuit board is disposed within the arrangement area (S) of the reinforcing plate. On the other hand, the other connecting end portion (probe side) of the wiring path of the circuit board is disposed to be dispersed in an arrangement area (S) wider than the arrangement area (S) of the reinforcing plate.

An electrical connecting apparatus comprising: a circuit board on which a reinforcing plate is mounted and a plurality of first electric connections are provided; a probe board on which second electric connections corresponding to the first electric connections are provided, with a plurality of probes electrically connected to the corresponding second electric connections; an elastic connector having plural pairs of both contacts capable of contacting the first and second electric connections corresponding to each other of both boards therebetween and receiving a biasing force in directions for both contacts to separate from each other; screw members for integrally combining them; and a spacer member for holding the probe tips substantially on the same plane by tightening of the screw members. Between the reinforcing plate and the probe board, a spacer plate is inserted for adjusting a distance from the other surface of the probe board to the probe tips.

A probe having a first and a second arm portion extending between first and second connecting portions connecting the first and second arm portions respectively at their front end portion and base end portion, and a needle point portion below the first connecting portion. At least one of the entire first and second arm portions or the upper or lower edge portions of the first and second arm portions are arcuate.

Growing community of inventors

Aomori, Japan

Akihisa Akahira