Shimadzu Corporation

Osaka University

Akihiro Nishimura

Toshinori Yoshimuta

Koichi Tanabe

Satoshi Sano

Takahiro Doki

Akira Horiba

Taro Shirai

Kenji Kimura

Susumu Adachi

Toshiyuki Sato

Shoichi Okamura

Shingo Furui

Shinya Hirasawa

Keiichi Fujii

Shigeya Asai

Kenji Sato

Heiji Watanabe

Takayoshi Shimura

Takuji Hosoi

An X-ray spectroscopic analysis apparatus includes: a radiation source configured to irradiate a predetermined irradiation area in the surface of a sample with an excitation beam for generating a characteristic X-ray; an analyzing crystal provided facing the irradiation area; a slit provided between the irradiation area and the analyzing crystal, the slit being parallel to the irradiation area and a predetermined crystal plane of the analyzing crystal; and an X-ray linear sensor including linear detection elements arranged in a direction perpendicular to the slit, the detection elements each having a length in a direction parallel to the slit. By detecting characteristic X-rays from different linear portions of the irradiation area for each wavelength, it is possible to perform analysis with sensitivity higher than the sensitivity of a conventional X-ray spectroscopic analysis apparatus that irradiates a point-like irradiation area with an excitation beam.

X-ray spectroscopic analysis apparatus and elementary analysis method

[PROBLEM TO BE SOLVED] To provide a radiation phase contrast imaging device having a small device configuration [SOLVING MEANS] The present invention focused on the findings that the distance between the phase gratingand the FPDdoes not need to be the Talbot distance. The distance between the phase gratingand the FPDcan be more freely set. However, a self-image cannot be detected unless the self-image is sufficiently magnified with respect to the phase grating. The degree on how much the self-image is magnified on the FPDwith respect to the original phase gratingis determined by a magnification ratio X/X. Therefore, in the present invention, the magnification ratio is set to be the same as the magnification ratio in a conventional configuration. With this, even if the distance Xbetween the radiation sourceand the FPDis reduced, a situation in which the self-image cannot be detected by the FPDdue to the excessively small size thereof does not occur.

Radiation phase contrast imaging device

In an X-ray imaging device according to a first embodiment, an X-ray detector has a configuration in which scintillator elements are defined by light-shielding walls in a lattice shape. Among X-rays incident on the X-ray detector, X-rays incident on the light-shielding walls are not converted into scintillator light and are transmitted by the X-ray detector. Accordingly, by causing X-rays to be incident on the X-ray detector in which the scintillator elements are defined by the light-shielding walls in a lattice shape, an area in which X-raystransmitted by a subject M are incident on the X-ray detector can be limited to an arbitrary range. Accordingly, since a detection mask can be omitted in the X-ray imaging device which is used for EI-XPCi, it is possible to reduce a manufacturing cost of the X-ray imaging device.

X-ray imaging device

A X-ray detector having enhanced X-ray sensitivity, which enables dual energy imaging having high diagnostic performance. This X-ray detector includes: scintillator elements which are partitioned by light blocking walls and which convert low-energy X-rays to light; and scintillator elements which are partitioned by light blocking walls and which convert high-energy X-rays to light. When seen from the direction of incidence of the X-rays, the positional pattern of the light blocking walls and that of the light blocking walls are configured so as not to be in alignment with each other. Accordingly, the X-rays incident on the X-ray detector are converted to light by at least either one of the scintillator elements and are finally outputted as X-ray detection signals.

X-ray detector

A radiographic apparatus removes lag-behind parts from radiation detection signals taken from an FPD as X rays are emitted from an X-ray tube, on an assumption that the lag-behind part included in each X-ray detection signal is due to an impulse response formed of a plurality of exponential functions with different attenuation time constants. When a single attenuation time constant and intensity are provisionally set, checking is made whether an attenuation to a noise level of X-ray detection signals occurs in an X-ray non-emission state following an X-ray emission state. When the set attenuation time constant and intensity are found appropriate (OK), the impulse response having the single exponential function is determined valid. Corrected radiation detection signals are obtained by removing the lag-behind parts using the impulse response determined.

Radiographic apparatus and radiation detection signal processing method

In the radiographic apparatus according to this invention, when a radiographic mode designatordesignates a non-standard radiographic mode, a signal correctoruses defect information stored in one of non-standard image defect information memoriesB&#x2013;E for correcting X-ray detection signals outputted from an FPDSince the pixel defect information for non-standard X-ray images is acquired by a pixel defect information converterthrough a conversion from defect information for standard X-ray images stored in a standard image defect information memoryA, it is unnecessary to collect output signals for pixel defect information acquisition from the FPDall over again. As a result, abnormal X-ray detection signals due to defects of radiation detecting elements may be corrected promptly, regardless of how the radiation detecting elements are assigned to the pixels in the X-ray images.

Radiographic apparatus, and radiation detection signal processing method

Growing community of inventors

Kyoto, Japan

Akihiro Nishimura