Matsushita Electric Industrial Co., Ltd.

The Kansai Electric Power Co., Inc.

Akihiro Miura

Shinji Nakamura

Toshihiro Nishii

Toshiaki Takenaka

Kunio Kishimoto

Daisuke Ishiko

Osamu Kamada

Kazurou Toda

Hisashi Minemoto

Satoshi Ishizuka

It is possible to obtain a clean high-quality circuit board by removing affected material and foreign matter produced when a hole is formed. A manufacturing method of the circuit board includes (a) preparing a film-coated board material by bonding a film material as a mask to a board material, (b) forming a hole in the film-coated board material by applying a laser beam thereto, and (c) selectively removing the unnecessary material sticking to the film-coated board material from the film-coated board material by supersonic cleaning without peeling the film material off the board material. Unnecessary material such as foreign matter is produced when the hole is formed, and the unnecessary material sticks to the board material. After removal of such unnecessary material, a conductive material is disposed in the hole, using the film material as a mask, and the film material is later removed from the board material.

Method of manufacturing a circuit board and its manufacturing apparatus

A method and system of cleaning to remove cutting dust and the like generated and adhering to a board material () during drilling for electrical connection, and drying the board material, in a process of manufacturing a circuit board for small electronic equipment and the like. A large amount of board materials can be treated without receiving thermal damage by performing the steps of: placing sheets of the board material that have absorbed moisture resulting from cleaning, like a stack in a vacuum chamber (); and drying the board material by repeating evacuation and pressurization under predetermined conditions while heating the board material.

Method and system of drying materials and method of manufacturing circuit boards using the same

A magnetic field measurement apparatus with high sensitivity and high accuracy in which a Bi-substituted rare-earth iron garnet crystal with a high and no temperature dependent sensitivity constant grown by liquid phase epitaxy is used for a magneto-optic element.

Magnetic field measurement apparatus

A current and voltage detector for a distribution system is provided with a lower section, an upper section and a fastener for combining the lower and upper sections into one body. The lower section comprises: a first groove for receiving an electric wire of the distribution system; an optical type current sensor; an optical type voltage sensor; and a potential divider for supplying a voltage to the voltage sensor. The upper section comprises: a second groove for receiving the electric wire; and a U-shaped magnetic core for applying a magnetic field to the current sensor.

Current and/or voltage detector for a distribution system

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Osaka, Japan

Akihiro Miura