Ishida Co. Limited

Akihiro Maenaka

Futoshi Yurugi

Ken Iwakawa

Yoshinori Tarumoto

Hironori Tsutsumi

Makoto Nakatani

An X-ray inspection apparatus includes an X-ray source configured to irradiate an article with X-rays in a plurality of energy bands, an X-ray detection unit capable of detecting the X-rays by a photon counting method, an image generation unit configured to generate an overall transmission image corresponding to the X-rays in all of the plurality of energy bands and a transmission image corresponding to the X-rays in some of the plurality of energy bands on the basis of a detection result of the X-rays by the X-ray detection unit, and an inspection unit configured to inspect the article on the basis of the overall transmission image and the transmission image.

X-ray inspection apparatus

An inspection device inspects of goods that include plural articles that sometimes overlap each other. An X-ray inspection device irradiates goods containing plural articles having a predetermined shape and inspects the goods on the basis of inspection images obtained from radiation that has passed through the goods or radiation that has reflected off the goods. The X-ray inspection device includes a storage component, a learning component, and an inspection component. The storage component stores, as teaching images, at least the inspection images of the goods that are in a state in which the plural articles overlap each other. The learning component acquires, by machine learning using the teaching images stored in the storage component, features relating to the goods that are in a state in which the plural articles overlap each other. The inspection component inspects the goods using the features that the learning component has acquired.

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Ritto, Japan

Akihiro Maenaka