International Business Machines Corporation

Mitsubishi Denki Kabushiki Kaisha

Keio University

Nikko Chemicals Co., Ltd.

Cosmos Technical Center Co., Ltd.

Kuroda Consulting Incorporated

Akihiro Kuroda

Masafumi Nishimura

Yoshinao Kobayashi

Tatsushi Higashi

Hiroaki Tosa

Makoto Kobayashi

Yoshitami Sakaguchi

Kazuo Sekiya

Yoshitaka Kamo

Kazuhide Sugawara

Kouichi Asakura

Koichi Toshioka

Takeshi Matsushita

An object is to develop a measurement method, and a measurement substrate, for measuring SPF or other value in a single measurement, instead of having to measure it on many substrates as has been the case to date. As a solution, a substrate for UV transmittance evaluation, including a base material that allows UV rays in a range of 290 to 400 nm to transmit through, and a layer provided on one side thereof that contains at least one type of compound other than cellulose triacetate that has a sugar skeleton but is not a salt, is provided.

Substrate for UV transmittance evaluation of cosmetics and evaluation method

An object is to measure absorbance of aqueous cosmetic materials that have not heretofore been studied for absorbance measurement, and particularly to form a uniform layer of thin film in order to ensure accurate measurement without causing these aqueous cosmetic materials, which are O/W emulsions, to undergo phase separation during measurement. As a means for achieving the foregoing, an absorbance measurement method is provided, wherein an absorbent aqueous composition is applied on the surface of a substrate, which surface has been plasma treated, arc-discharge treated, or corona-discharge treated, to achieve a contact angle with pure water of 0 to 70.0 degrees, and the applied absorbent aqueous composition is measured for absorbance.

Method and device for measuring absorbance of aqueous compositions using a substrate having a surface with an adjusted contact angle with water

An analog driver for a liquid crystal display has sample hold circuits and buffer amplifiers divided into one group for positive inputs and the other groups for negative inputs which buffer amplifiers are selected in accordance with a first and second control signals thereby reducing the power consumption by the driver of buffer amplifiers. Furthermore, when none of the buffer amplifiers are selected, the data lines are held at common voltage to reduce the consumed power by the buffer amplifiers.

Liquid crystal display panel driving device

Sample chips are tested after determining the chip layout on a semiconductor wafer so that one or plural ones of untested chips are surrounded by plural ones of the sample chips that adjoin the untested samples. A good/defective judgment on the untested chips is performed by using predicted good/defective judgment results that are statistically predicted based on results of the sample test and stored statistical data of a defect generation profile including address information that indicates defective chip locations. As a result, the good/defective judgment can be performed with high accuracy even in a case where defective chips are localized in a particular region on the wafer in a concentrated manner.

Test method of chips in a semiconductor wafer employing a test algorithm

Common electrode driving device in a liquid crystal display

A plurality of solder balls are arranged at a main surface of a BGA type semiconductor device. A test terminal is provided on the main surface adjacent to the solder ball. A contact pin of an IC socket is abutted against this test terminal. Accordingly, favorable electrical connection between a contact pin and a protruding external electrode can be achieved while suppressing deformation of the external electrode in testing a semiconductor device prior to mounting.

Semiconductor device with test terminal and IC socket

A signal processing card packaged on a bus of a personal computer has a bus master which is used to access the main memory of the personal computer. A large table of probability values required for speech recognition is held in the main memory. When a label to be processed is generated, only the necessary part of the table is read from the main memory to the memory on the signal processing card by direct memory access transfer to perform speech recognition processing.

Speech recognition system having an interface to a host computer bus for

Speaker adaptation which enables a person to use a Hidden Markov model type recognizer previously trained by another person or persons. During initial training, parameters of Markov models are calculated iteratively by, for example, using the Forward-Backward algorithm. Adapting the recognizer to a new speaker involves (a) storing and utilizing intermediate results or probabilistic frequencies of a last iteration of training parameters, and (b) calculating new parameters by computing a weighted sum of the probabilistic frequencies stored during training and frequencies obtained from adaptation data derived from known utterances of words made by the new speaker.

Speech recognition method

A data processing system is provided which includes ALU data busses, temporary operand storage registers, an accumulator, and a set of latches for temporarily storing data to be supplied to the input of the ALU. Output multiplexer is provided which can select the output of one of the latches or that of the ALU which is sent to the accumulator. A detector is also provided for determining whether the smaller or larger one of two data elements is stored in said latches according to the status of the ALU and a new MIN/MAX instruction and the selected data element is returned to a predetermined temporary storage register via the output multiplexer. A controller operates in cooperation with the system instruction decoder to effect this operation with a single machine instruction. In determining the minimum or maximum of N data elements, it is only necessary to execute the MIN or MAX operations N-1 times, whereby the maximum or the minimum can be easily determined, the length of the program shortened, and the execution time reduced.

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Yokohama, Japan

Akihiro Kuroda