Horiba, Ltd.

Akihiro Hirano

Koichi Nagai

Juichiro Ukon

Takahiro Yamada

Takeshi Yamada

Masahiro Tanimoto

Yasushi Hirata

Katsuya Tsuji

Morinobu Hayashi

Kohei Ikegami

Yasuyuki Nishioka

Takeshi Uemura

A sample preprocessing deviceis to preprocess a sample (W) analyzed by a analysis deviceby applying heat to the sample, and comprises a heating furnacethat applies heat to the sample (W), a discharging portPfrom which the sample (W) heated by the heating furnaceis discharged by dropping the sample (W), and a posture restriction unit (PR) that restricts a posture of the sample (W) that drops in the discharging portP

Sample preprocessing device and analysis system

In order to provide an elemental analyzer that, without providing a buffer tank, can cope with measurements of a low concentration sample to a high concentration sample on the basis of a simple configuration, the elemental analyzer is provided with: an extraction furnaceadapted to heat a sample contained in a crucible R, and gasify an element contained in the sample into sample gas; an introduction flow path Ladapted to introduce carrier gas into the extraction furnace; a lead-out flow path Ladapted to, from the extraction furnace, lead out mixed gas in which the sample gas and the carrier gas are mixed; an elemental analysis partthat is provided in the lead-out flow path Land analyzes elements contained in the mixed gas; a bypass flow path Lthat branches from the introduction flow path Land joins the lead-out flow path L; and a valvethat is provided in the bypass flow path Land can adjust an opening level.

Elemental analyzer

The invention provides a glow discharge optical emission spectrometer for intermittently applying a high frequency voltage to a sample and obtaining a measured value from a spectroscope in synchronization with a timing of a unit of application during intermittent application. The obtaining of measured values in which is introduced noise at a non-application time during intermittent application is prevented, and by applying a high voltage value to the sample with a minimized adverse effect on a voltage application to the sample, high-level measured values are obtained. By obtaining a measured value a plural number of times during a unit of application, a large number of measured values are obtained in a short period of time, resulting in a reduction in measurement time.

Glow discharge optical emission spectrometer and glow discharge optical emission spectrometry

The present invention discloses a system for analyzing elements contained in a sample in very slight amounts, such as C, S, O, N, H and the like in materials, such as steel and ceramics. An element analyzer can gasify the sample elements in an appropriate gas, such as oxygen gas in a high-frequency heating furnace or an electric resistant furnace. Resulting gas can be introduced into a mass spectrometer to permit a quantitative analysis of the sample elements. A metal sample can be levitated and heated and melted with induction current for producing the resultant gas for introduction to a mass spectrometer.

Combustion furnace system for analyzing elements in a sample

A high-frequency induction heater having a working coil for providing a high-frequency application of power to a sample is provided with a control circuit for controlling the amount of power to the working coil. A phase control member can be triggered to provide a first level of power to the sample to heat it below its combustion level, to thereby remove any exterior stains. Subsequently, a second level of power can be applied for a predetermined period of time to heat it to a combustion point whereby the combustion gases of the sample are free from any byproducts of the stain and an accurate measurement can be accomplished.

High-frequency induction heater and power source circuit for same

A sample analyzer to detect elements in a gaseous residue generated in an extraction furnace. The sample analyzer introduces the gaseous residue into a detector to be analyzed. The sample analyzer employs a buffer vessel having a variable internal capacity disposed between the extraction furnace and the detector. The variable capacity buffer vessel provides the capability to accurately analyze samples having wide variations in the concentration of substances to be analyzed.

Sample analyzer

A gas analyzer for simultaneously measuring a plurality of ingredients of a sample gas has a sample gas-introducing passage, a sample gas, flow-divider connected to the gas-introducing passage for dividing the sample gas into a plurality of gas flows in a desired flow-dividing ratio, a sample gas-diluter connected to the flow-divider for diluting the plurality of divided sample gas flows, and a plurality of gas concentration detectors, one for each gas flow, and connected in parallel with each other to said sample gas-diluter for receiving the respective diluted gas flows from the sample gas-diluter.

Growing community of inventors

Kyoto, Japan

Akihiro Hirano