Growing community of inventors

Tokyo, Japan

Akihiko Yoshikawa

Average Co-Inventor Count = 3.43

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 32

Akihiko YoshikawaKenji Kawasaki (2 patents)Akihiko YoshikawaKenichi Koyama (2 patents)Akihiko YoshikawaHirobumi Suzuki (2 patents)Akihiko YoshikawaYoko Ohashi (2 patents)Akihiko YoshikawaKiyotsugu Kojima (2 patents)Akihiko YoshikawaMasahiro Aoki (1 patent)Akihiko YoshikawaAtsuhiro Tsuchiya (1 patent)Akihiko YoshikawaKazuhiro Hayashi (1 patent)Akihiko YoshikawaTetsuya Shirota (1 patent)Akihiko YoshikawaTakayuki Kono (1 patent)Akihiko YoshikawaMasayoshi Karasawa (1 patent)Akihiko YoshikawaYasuko Ishii (1 patent)Akihiko YoshikawaIzumi Sakuma (1 patent)Akihiko YoshikawaAkihiko Yoshikawa (6 patents)Kenji KawasakiKenji Kawasaki (66 patents)Kenichi KoyamaKenichi Koyama (38 patents)Hirobumi SuzukiHirobumi Suzuki (10 patents)Yoko OhashiYoko Ohashi (5 patents)Kiyotsugu KojimaKiyotsugu Kojima (2 patents)Masahiro AokiMasahiro Aoki (51 patents)Atsuhiro TsuchiyaAtsuhiro Tsuchiya (32 patents)Kazuhiro HayashiKazuhiro Hayashi (27 patents)Tetsuya ShirotaTetsuya Shirota (23 patents)Takayuki KonoTakayuki Kono (22 patents)Masayoshi KarasawaMasayoshi Karasawa (13 patents)Yasuko IshiiYasuko Ishii (10 patents)Izumi SakumaIzumi Sakuma (9 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Olympus Corporation (6 from 8,194 patents)


6 patents:

1. 8699129 - Microscope system, storage medium storing control program, and control method

2. 8280142 - Predetermined site luminescence measuring method, predetermined site luminescence measuring apparatus, expression amount measuring method, and measuring apparatus

3. 8194313 - Microscope and lamphouse

4. 7986824 - Predetermined site luminescence measuring method, predetermined site luminescence measuring apparatus, expression amount measuring method, and measuring apparatus

5. 7945108 - Microscope apparatus control method and microscope apparatus

6. 7825360 - Optical apparatus provided with correction collar for aberration correction and imaging method using same

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