Fujitsu Corporation

Akihiko Harada

Robert Paul Masleid

Kazuhiro Furuya

Christophe Giacomotto

Takahito Takemoto

Hisashi Watanabe

Sadanori Akiya

Christopher Giacomotto

To accurately measure power source noise generated inside an integrated circuit, the power source noise measuring device comprises: a mutual inductor pair placed inside an integrated circuit, the mutual inductor pair including (i) a first inductor connected to between power source voltages of the integrated circuit and (ii) a second inductor arranged opposite the first inductor, the both ends of which second inductor are connected to external output terminals; and a power source noise measuring unit which measures power source noise of the integrated circuit on the basis of a voltage waveform output from the second inductor of said mutual inductor pair via the external output terminals.

Technique for measuring power source noise generated inside integrated circuit

Power source noise measuring device, integrated circuit, and semiconductor device

The present invention provides a semiconductor device having a plurality of functional blocks and a select signal generation circuit for supplying a select signal to a functional block to be operated out of the plurality of blocks. A clock generation unit in the function clock, to which the select signal and a system clock are supplied, generates a control clock based on the system clock when the select signal is being supplied, and stops generation of the control clock when the select signal is not being supplied. When the select signal is not received, a dynamic circuit provided inside the functional block does not operate since the control clock is not supplied. When the select signal is received, the control clock is supplied and the dynamic circuit repeats precharge and discharge for each clock cycle, and performs operation to execute a predetermined function, and consumes power.

Semiconductor device using dynamic circuit

An insulated gate type semiconductor device comprised of a semiconductor layer serving as an active region isolated from a semiconductor substrate by a substrate isolation insulating film and a T-shaped gate electrode comprised of a trunk-shaped main gate electrode and a crosspiece-shaped conductor pattern provided on the semiconductor layer, wherein the thickness of the gate insulating film directly under the crosspiece-shaped conductor pattern is made greater than the thickness of the gate insulating film directly under the main gate electrode, whereby it is possible to prevent short-circuits between electrodes, prevent short-circuits between separators, and prevent an increase of the parasitic capacitance.

Insulated gate type semiconductor device and method for fabricating same

In a packaged integrated circuit, the package inductance limits the rate at which off-chip current may be varied in response to a change in on-chip current demand of the integrated circuit. The present invention provides an on-chip voltage regulator circuit for regulating multi-cycle voltage fluctuations of an integrated circuit associated with changes in current demand of the integrated circuit. The voltage regulator sources current to prevent an undervoltage conditions and sinks current to prevent an overvoltage condition.

Optimal inductor management

Four-state switched decoupling capacitor system for active power stabilizer

A complement reset multiplexer latch is provided. The complement reset multiplexer latch selectively regenerates a first or a second data input signal on an output node. To react to rising edges of the first or the second data signal, the complement reset multiplexer latch includes a first and a second rising edge pulse reset control. To react to falling edges of the first or the second data signal, the complement reset multiplexer latch includes a first and a second falling edge pulse reset control. The complement reset multiplexer latch also selectively holds the output node at a stored value responsive to a clock signal. A multiplexer is used to select from the first or the second data input the value that is stored.

Growing community of inventors

Kawasaki, Japan

Akihiko Harada