Hitachi Astemo Ltd.

Akeo Satoh

Akira Kotabe

Tatsuo Nakagawa

Masahiro Matsumoto

Kazunori Nemoto

Tomoki Takamoto

An object of the present invention is to provide a semiconductor device capable of diagnosing disconnection of a signal line that transmits a command signal in an inspection process even if the command signal is assumed not to be transmitted in the inspection process. A semiconductor device according to the present invention includes a first semiconductor integrated circuit and a control circuit, the control circuit includes a means for controlling a signal line in response to a response signal from the first semiconductor integrated circuit, and the control circuit further includes a means for controlling the signal line regardless of a signal from the first semiconductor integrated circuit.

Semiconductor device

An electronic circuit that recognizes a disconnected state from an outside during disconnection of a power supply line is provided. For this purpose, an electronic circuit includes: a load provided between a power supply line and an output terminal in the electronic circuit; a transistor provided between the load and the output terminal; a current generation circuit that generates current using a power supply voltage at a power supply line in the electronic circuit; and a control circuit that controls the transistor using a control voltage that changes according to the current generated by the current generation circuit.

Electronic circuit and sensor system

An electronic circuit including an output circuit capable of reducing breakage while satisfying the characteristics of an output signal is provided. For this purpose, the electronic circuit includes output signal generation elementsandconfigured to generate an output signal, switchesand, and a voltage monitor circuitconfigured to monitor a voltage applied to an output terminal. Here, the output signal generation elementsandare connected to the output terminalvia the switchesand, and the voltage monitor circuitis configured to be able to measure a voltage higher than a power supply voltage VDD connected to the output signal generation elementand controls the switchesandso as to disconnect the output signal generation elementsandand the output terminalwhen the voltage of the output terminalbecomes equal to or higher than a predetermined value set higher than the power supply voltage VDD.

A semiconductor integrated circuit device and an inspection method for a semiconductor integrated circuit device capable of improving burn-in screening quality by improvement in an activation rate of a DSP without operating a diagnostic circuit at the time of wafer level burn-in in a semiconductor integrated circuit device incorporating an analog circuit and the diagnostic circuit for the analog circuit are provided.

Semiconductor integrated circuit device and inspection method for semiconductor integrated circuit device

Provided are a semiconductor device and a sensor system capable of achieving improvement of noise resistance. Thus, an output circuitin the semiconductor device includes: input terminals; and an output terminal; an output amplifierconnecting the input terminalsto the output terminal; a feedback elementreturning the output terminalto the input terminal; a switching transistor; and a resistance element. A drain of the switching transistoris connected to the input terminal. The resistance elementis provided between a back gate of the switching transistorand a power source Vdd and has impedance of a predetermined value or more for suppressing noise of a predetermined frequency generated at the input terminal

Semiconductor device and sensor system

To prevent an output of an intermediate potential by suppressing sneaking of a current from a signal line to a power line at the time of disconnection of a power supply. A control circuit which receives a power supply voltage from a power line Land outputs an output signal to a signal line Lincludes: a load Rwhich is provided between the power line and the signal line; a first transistor Pwhich is provided between the load and the signal line; a second transistor Pwhich is provided between a well of the first transistor and the power line; and a gate control circuitwhich connects a gate terminal of the first transistor and a gate terminal of the second transistor to the signal line and turns off the first transistor and the second transistor, at the time of disconnection of a power supply.

Growing community of inventors

Hitachinaka, Japan

Akeo Satoh