Nec Research Institute, Inc.

Ajit Krishnan

Mark J Higgins

Sabyasachi Bhattacharya

Michael M J Treacy

Tineke Thio

Henri Joseph Lezec

Thomas W Ebbesen

Tae J Kim

A method for reducing imprint in a ferroelectric device which includes the steps of: applying a signal having a bipolar pulse shape for a predetermined time to the ferroelectric device; and decreasing the signal amplitude gradually in predetermined intervals of time and amplitude. Preferably, the bipolar shape signal is a sinusoidal wave, a square wave, or a sawtooth wave and the ferroelectric device is a capacitor of a memory cell in a computer. Also provided is an apparatus for reducing imprint in a ferroelectric device.

Reduction of imprint in ferroelectric devices using a depoling technique

A method for reducing imprint in a ferroelectric device which includes the steps of: applying a signal having a bipolar pulse shape for a predetermined time to the ferroelectric device; and decreasing the signal amplitude gradually in predetermined intervals of time and amplitude. Preferably, the bipolar shape signal is a sinusoidal wave, a square wave, or a sawtooth wave and the ferroelectric device is a capacitor or a memory cell in a computer. Also provided is an apparatus for reducing imprint in a ferroelectric device.

An apparatus for enhanced light transmission through a perforated metal film is provided. The apparatus comprises a metal film having a first surface and a second surface, at least one aperture provided in the metal film and extending from the first surface to the second surface, and first and second dielectric layers. The first dielectric layer is provided substantially adjacent to the first metal film surface, and the second dielectric layer is provided substantially adjacent to the second metal film surface. The respective refractive indices of the first and second dielectric layers are substantially equal. Light incident on one of the surfaces of the metal film interacts with a surface plasmon mode on at least one of the surfaces of the metal film thereby enhancing transmission of light through the at least one aperture in the metal film. The apparatus may have a single aperture or a plurality of periodically arranged apertures, and the metal film surface may be provided with or without a periodic surface topography for further enhanced transmission. Wavelength-selective optical filters, spatial optical filters, light collectors, near-field scanning optical microscope probes and photolithographic masks are also provided.

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Hightstown, NJ, United States of America

Ajit Krishnan