Seagate Technology Incorporated

AikChuan Lim

UttHeng Kan

Edmun ChianSong Seng

Xiong Liu

Stephen KowChiew Kuan

Wei Zhang

Harry Tiotantra

Utt Heng Kan

Lin Nah Lim

Det Hau Wu

KayHee Tang

Kay Hee Tang

Jeffrey Soon Beng Sim

ChoonWei Ng

Edmund ChianSong Seng

Det Hua Wu

A method includes writing first data to a first track of a magnetic recording medium of a storage device. First parity sectors corresponding to the first data are written. The first parity sectors have a first size. Second parity sectors corresponding to the first data are written. The second parity sectors have a second size. Second data is written to a second track of the magnetic recording medium. The second track is adjacent to the first track. It is determined whether an unrecoverable data error has occurred on the second track. After writing to the second track and determining that no unrecoverable data error has occurred, the first and second parity sectors corresponding to the first data are released.

Mode hop mitigation solutions in a heat-assisted magnetic recording head

A method to map defects is provided. A select data track of a storage medium is scanned for a defect. At least one data wedge affected by the defect on the select data track is identified. Each data wedge includes available area for writing user data defined between two servo wedges that include position information. The at least one affected data wedge is identified as unusuable.

Mapping defects on a data wedge basis

A method is provided. The method includes determining that a data sector included in a select data track is in error, the data sector in error includes at least one identified data wedge. The at least one defective data wedge in the data sector in error is located. The method also includes moving the at least one defective data wedge by utilizing at least one spare wedge on the select data track.

Defect reallocation for data tracks having large sector size

A data recording apparatus includes a surface having a plurality of data tracks with leading track portions. A head moves along head paths over the data tracks to provide data access. The data access has a reduced reliability along a limited number of the leading track portions. Trailing path additions follow the head paths for the limited number of leading track portions. The trailing path additions providing overlapping data access for the limited number of leading track portions.

Overlapping data track access

Systems and methods are provided through which a time domain equalized signal-to-noise-ratio (ESNR) of an electronic device is determined by executing ESNR determining firmware in the electronic device. The ESNR is used to perform rejection/acceptance testing of the electronic device during manufacturing of the device, and/or to perform read channel tuning and optimization. In one embodiment, determination of the ESNR includes both phase level retry and global level retry.

System and method to determine the time domain equalized signal-to-noise ratio of a mass storage device

A number of data pairs, each data pair comprises a write-to-read track misregistration (WRTMR) value and an average position error margin (APE) value, are determined for a data storage device. Each of the data pairs is associated with a unique predetermined non-repeatable runout (NRRO) error in the data storage device. Each of the predetermined NRRO errors is caused by subjecting the data storage device to a unique NRRO error stimulus. An ideal APE margin is then determined for the data storage device by using the data pairs to extrapolate an APE margin corresponding to a WRTMR value of zero.

Average position error measurement in a data storage device

A method and data storage device determine an equalized signal-to-noise ratio in the storage device. The equalized signal-to-noise ratio is determined by generating an analog read signal, passing the read signal through an equalizer in the storage device, and sampling the equalized signal using an analog-to-digital converter in the storage device. The samples from the analog-to-digital converter are then used in the equalized signal-to-noise calculation.

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Singapore, Singapore

AikChuan Lim