Shenzhen Futaihong Precision Industry Co., Ltd.

Fih (hong Kong) Limited

Sutech Trading Limited

Ai-Ge Sun

Lei Li

Ping Chen

Zhi Feng Cheng

Chang-Fa Sun

Lin-Sen Dong

Xue-Liang Zhai

A testing device () configured for testing a multihole workpiece () with a plurality of holes (), includes a detecting station () and an inspecting box (). The detecting station positions a plurality of detecting pins () and a plurality of detecting apparatus (). The detecting pins correspond to the holes of the multihole workpiece. The detecting apparatus respond for the multihole workpiece and sending detecting signals. The inspecting box receives the detecting signals from the detecting apparatus of the detecting station, and deals with and shows detecting results.

Testing devices for multihole workpiece

A testing system for testing flatness of a surface of a workpiece includes a testing apparatus () and a processor (). The testing apparatus includes a testing box () and a measuring apparatus (). The testing box includes a plurality of holders (); the holders define a datum plane. The measuring apparatus comprises a plurality of movable testing poles () extending out of the testing box and a plurality of gauges () configured for measuring distance of the testing poles retracting into the testing box. Ends () of the testing poles away from the testing box are located at the datum plane and configured for supporting the surface of the workpiece thereon to allow the gauges measuring retracting distance of the testing poles under the pressure of the workpiece. The retracting distance of the testing poles is equal to distances between testing points on the surface of the workpieces and the datum plane. The processor is connected to the testing apparatus for receiving and processing testing data that are converted from the retracting distance of the testing poles measured by the gauges.

Testing system for flatness and parallelism

Growing community of inventors

Shenzhen, China

Ai-Ge Sun